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Advances in µ - XRF
Analysis of Elemental Distribution in Three Dimensions
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The macroscopic properties of technical materials are often determined by their elemental composition. Because most technical materials are inhomogeneous analytical methods are required that allow elemental analysis of these inhomogeneities - not only as a point by point measurement but also as a complete 2D-distribution. Micro X-ray fluorescence (µ XRF) has recently been established for this purpose. The availability of X-ray optics that capture a large solid angle of tube radiation and concentrate this to small sample areas down into the range of 25 µm makes position sensitive elemental analysis possible with µ XRF.
Authors:
Dr. Michael Haschke, Bruker Nano GmbH, Germany
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Keywords: Bruker Nano Material Analysis Micro X-ray Fluorescence X-Ray Analysis X-ray Optics XRF
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