AFM Tools for Nanoscale Electrical Characterization
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This application note discusses the unique nanoelectrical characterization tools and techniques of Asylum Research Cypher and MFP-3D AFMs for a wide range of applications.
Read the complete application note: here.
Characterizing electrical functionality on nanometer length scales is an important process that continues to grow as devices shrink and new nanomaterials emerge. Oxford Instruments Asylum Research provides AFM tools to evaluate local electrical properties, including current, surface charge and potential, dielectric breakdown, conductivity, and permittivity. Asylum's Cypher and MFP-3D family of AFMs provide special features and unique capabilities for meaningful electrical measurements for a wide range of applications.