Sep. 19, 2016
Applications

AFM Tools for Nanoscale Electrical Characterization

  • Kelvin Probe Force Microscopy (KPFM) surface potential overlaid on topography for flakes of boron nitride (small triangles) and graphene (large irregular features) grown on a copper foil substrate Kelvin Probe Force Microscopy (KPFM) surface potential overlaid on topography for flakes of boron nitride (small triangles) and graphene (large irregular features) grown on a copper foil substrate

This application note discusses the unique nanoelectrical characterization tools and techniques of Asylum Research Cypher and MFP-3D AFMs for a wide range of applications. 

Read the complete application note: here.

Characterizing electrical functionality on nanometer length scales is an important process that continues to grow as devices shrink and new nanomaterials emerge. Oxford Instruments Asylum Research provides AFM tools to evaluate local electrical properties, including current, surface charge and potential, dielectric breakdown, conductivity, and permittivity. Asylum's Cypher and MFP-3D family of AFMs provide special features and unique capabilities for meaningful electrical measurements for a wide range of applications.

More information:
AFM.info@oxinst.com
www.oxford-instruments.com/AFM

Editor
Stefanie Krauth
 

Contact

Asylum Research
6310 Hollister Ave. 0
93117 Santa Barbara, CA
USA
Phone: +1 805 696 6466
Telefax: +1 805 696 6444

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