Jul. 03, 2015
Applications

Correlative Microanalysis

Combining Benchtop μ-XRF with SEM-EDS Automated Feature Analysis for Advanced Mineral Classification and Ore Characterization

  • Ore thick section from the Sudbury Igneous Complex, Parkin dike. Top: part of the composite μ-XRF element map showing the distribution of iron, nickel, copper and silicon. Bottom: corresponding section of the single element map of cobalt. The yellow arrow indicates the association of cobalt and nickel in pentlandite, the red arrow points to an arsenide grain.Ore thick section from the Sudbury Igneous Complex, Parkin dike. Top: part of the composite μ-XRF element map showing the distribution of iron, nickel, copper and silicon. Bottom: corresponding section of the single element map of cobalt. The yellow arrow indicates the association of cobalt and nickel in pentlandite, the red arrow points to an arsenide grain.

The efficient characterization of ore minerals is becoming increasingly important to determine whether they have a sufficient content of sought-after valuable elements and consequently mining them is of economic interest. This article describes a procedure consisting of three analytical steps to investigate these factors on ore samples – thick sections – using benchtop micro-X-ray fluorescence (μ-XRF) spectrometry in combination with energy-dispersive spectrometry (EDS) on the scanning electron microscope (SEM).

Read the full article in the  PDF.

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