Scanning Electron Microscopy (SEM) has become a valuable tool for two- and three-dimensional characterization of micro- and nano-scale samples. A wide range of industry applications stand to benefit from this technology, e.g., materials research, development of pharmaceutical products, and process development in semiconductor or photovoltaic manufacturing. What they have in common: a specific region of a specimen has to be analyzed.
Related Articles :Email requestCompany Homepage
Carl Zeiss Microscopy GmbH
73447 Oberkochen, Baden-Württemberg
Tel: +49 7364 20 22 94
Fax: +49 7364 20 4970
Imaging & Microscopy Issue 4 , 2012 as free epaper or pdf download