Apr. 17, 2012
Applications

FIB-SEM with Laser Option

Innovative Tool with Greatly Improved Workflow for SEM Examination of Thin Film Solar Cells

  • Fig. 1a: Cross-section using laser ablation through a contact peak of a CIGS solar cell.Fig. 1a: Cross-section using laser ablation through a contact peak of a CIGS solar cell.

Scanning Electron Microscopy (SEM) has become a valuable tool for two- and three-dimensional characterization of micro- and nano-scale samples. A wide range of industry applications stand to benefit from this technology, e.g., materials research, development of pharmaceutical products, and process development in semiconductor or photovoltaic manufacturing. What they have in common: a specific region of a specimen has to be analyzed.

Contact

Carl Zeiss Microscopy GmbH
Carl-Zeiss-Str. 56
73447 Oberkochen, Baden-Württemberg
Germany
Phone: +49 7364 20 22 94
Telefax: +49 7364 20 4970

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