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FIB-SEM with Laser Option

Innovative Tool with Greatly Improved Workflow for SEM Examination of Thin Film Solar Cells

Apr. 17, 2012
Fig. 1a: Cross-section using laser ablation through a contact peak of a CIGS solar cell.
Fig. 1a: Cross-section using laser ablation through a contact peak of a CIGS solar cell. more
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Scanning Electron Microscopy (SEM) has become a valuable tool for two- and three-dimensional characterization of micro- and nano-scale samples. A wide range of industry applications stand to benefit from this technology, e.g., materials research, development of pharmaceutical products, and process development in semiconductor or photovoltaic manufacturing. What they have in common: a specific region of a specimen has to be analyzed.

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Keywords: Auriga CrossBeam Workstation Auriga FIB/SEM Carl Zeiss laser material research Scanning Electron Microscopy solar cells Thin Films

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Web: http://www.zeiss.com/microscopy



Imaging & Microscopy Issue 4 , 2012 as free epaper or pdf download

 

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