Mar. 03, 2016
Applications

Imaging Nanoparticle Arrays

Loading Method for Multiplexing Nanoparticle Characterization

  • Fig. 1: Illustration of the multiplex procedure for INA-TEM. (a) Sample uptake from 96- or 384-well plate. (b) Piezoelectric dispensing of samples onto the TEM or SEM support. (c) Imaging and characterization of nanoparticle arrays with TEM.Fig. 1: Illustration of the multiplex procedure for INA-TEM. (a) Sample uptake from 96- or 384-well plate. (b) Piezoelectric dispensing of samples onto the TEM or SEM support. (c) Imaging and characterization of nanoparticle arrays with TEM.

TEM and SEM measurements are commonly used methods for characterization of nanomaterials. Typically a single sample is applied onto an EM specimen holder or grid. Due to the fact that these grids have to be moved inside a vacuum chamber, the actual sample exchange may take several minutes depending on the EM instrument. Using a new loading technology, utilizing picoliter dispensing to print arrays of up to 100 samples on one EM support, results in a significant increase in sample throughput while decreasing operational costs in EM measurements significantly.

Read the complete article as PDF (Read Whitepaper)

References
[1] Mulligan S. et al.: Typhon : Multiplexed TEM Sample Preparation, Microsc. Microanal. (2014)
[2] A. Merkoci A.: Biosensing Using Nanomaterials, John Wiley & Sons (2009)
[3] Scienion: online available: http://www.scienion.com/company/technology/dispensable-media/

Authors
Robert Tannenberg1, Holger Eickhoff1, Wilfried Weigel1

Affiliation
1Scienion AG, Berlin, Germany

Contact
Dr. Wilfried Weigel (email request)

Scienion AG, Berlin, Germany
www.scienion.de

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