Dec. 01, 2014
Applications

Sub-25 nm Resolution STED Microscopy

Next Generation 2D- and 3D-STED Microscope with SLMs

  • Fig. 1: Left: A Two-color RESOLFT image of keratin 19 (rsCherryRev1.4, red) and vimentin (Dronpa-M159T, green), with a conventional widefield image of the same region in the upper left corner. The resolution with RESOLFT is better than 80 nm. Right: A two-color 2D-STED image of the nuclear pore complex protein gp210 (green) and pan-specific FG repeat marker (red). The resolution in the green channel is better than 25 nm; in the red channel, it is better than 35 nm. Upper left corner: A confocal image of the same region.Fig. 1: Left: A Two-color RESOLFT image of keratin 19 (rsCherryRev1.4, red) and vimentin (Dronpa-M159T, green), with a conventional widefield image of the same region in the upper left corner. The resolution with RESOLFT is better than 80 nm. Right: A two-color 2D-STED image of the nuclear pore complex protein gp210 (green) and pan-specific FG repeat marker (red). The resolution in the green channel is better than 25 nm; in the red channel, it is better than 35 nm. Upper left corner: A confocal image of the same region.
  • Fig. 1: Left: A Two-color RESOLFT image of keratin 19 (rsCherryRev1.4, red) and vimentin (Dronpa-M159T, green), with a conventional widefield image of the same region in the upper left corner. The resolution with RESOLFT is better than 80 nm. Right: A two-color 2D-STED image of the nuclear pore complex protein gp210 (green) and pan-specific FG repeat marker (red). The resolution in the green channel is better than 25 nm; in the red channel, it is better than 35 nm. Upper left corner: A confocal image of the same region.
  • Sub-25 nm Resolution STED Microscopy - Next Generation 2D- and 3D-STED Microscope with SLMs

STED microscopy was the first method to fundamentally break the diffraction barrier. Twenty year later, the latest generation of commercial STED microscopes further boosts the resolution by using programmable SLMs to shape and optimize the STED light pattern. This enables the highest resolutions currently possible with figures below 25 nm in 2D and below 80 x 80 x 90 nm in 3D.

Authors:
Dr. Matthias Reuss,
R&D Scientist
Dr. Benjamin Harke, R&D Scientist

Abberior Instruments GmbH
Göttingen, Germany

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Contact

Abberior Instruments GmbH
Hans-Adolf-Krebs-Weg 1
37077 Göttingen
Germany
Phone: +49 551 30724 170

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