![]() |
Confocal Raman imaging opened the door for many applications in Raman spectroscopy and imaging that were previously unavailable for measurement with conventional (non-confocal) Raman methods. However, high confocality always results in high focus sensitivity and this can make measurements difficult with rough and/or inclined samples. Especially when performing scans on a larger scale (scan size larger than 1 mm), this often necessitated careful alignment and extensive sample preparation. True Surface Microscopy adds optical profilometer functionality to a highly sensitive confocal Raman microscope. Using this profilometer function, topographic scans of several square millimeters can be acquired, similar to a very large AFM topography image. This large-area topography image can be used to trace the surface contours while acquiring a confocal Raman image.
Related Articles :
Keywords: Hyperspectral Imaging Material Analysis Raman Imaging Raman spectroscopy Topographic Scans WITec
Email requestCompany HomepageWITec GmbH
Lise-Meitner-Str. 6
89081 Ulm
Germany
Tel: +49 731 140 700
Fax: +49 731 140 7020
Web: http://www.witec.de
![]()
Imaging & Microscopy Issue 4 , 2012 as free epaper or pdf download
Reader comments (0)