The print edition is already available and you can order your sample copy using the contact button. The third issue will be online on 28th of October 2010.
EDITORIAL
page 3
I&M NEWS TICKER
page 6
EVENT CALENDAR
page 8
COMPANY NEWS
page 9
RMS IN FOCUS
Small Is Beautiful
Review of RMS International Micrograph Competition 2010
A. Winton, Royal Microscopical Society, St Clements, United Kingdom
page 10
NEWS FROM EMS
EMS Newsletter 31, August 2010
Prof. Dr. D. Schryvers, University of Antwerp, Belgium
page 12
EVENT REPORT
Back to the Roots
European Bioimaging Experts Met at the EMBL
Dr. M. Friedrich, GIT Verlag, Darmstadt, Germany
page 14
50 Years of Innovation
Nano-Analytics by SEM, TEM, and AFM
S. Langner, Bruker Nano, Berlin, Germany
page 16
ANNOUNCEMENTS
17th International Microscopy Congress (IMC17)
Rio de Janeiro, September 19 - 24, 2010G. Solórzano, PUC-Rio, Gávea, Rio de Janeiro, Brazil
page 18
Hands-on Microscopy at EMBL
page 18
COVERSTORY
Shuttle & Find for Life Science
Enabling Productivity in Correlative Microscopy
M. Wiederspahn, Carl Zeiss SMT AG, Oberkochen, Germany
page 19
CORRELATIVE MICROSCOPY
Bridging Microscopes Correlative Light and Scanning Electron Microscopy
R. Wepf et al., ETH Zurich, Switzerland
page 20
Architecture of the Crustacean Cuticle
Imaging of Mineralized Organic Matrix by LM, TEM and AFMN.
Žnidaršič et al., University of Ljubljana, Slovenia
page 23
SCANNING PROBE MICROSCOPY
Photocatalytic Systems Films Structure
AFM Analysis of Photocatalytic Chitosan Based Systems
V. A. Timofeeva et al., Semenov Institute of Chemical Physics RAS, Moscow, Russia
page 26
AFM-IR Enables Nanoscale Chemical Spectroscopy
C. Prater, Anasys Instruments, Santa Barbara, USA
page 29
ELECTRON MICROSCOPY
Single Carbon Atom Chains
Synthesis and Dynamics of One-dimensional Carbon Species
Prof. Dr. U. Kaiser, G. Algara-Siller, University Ulm, Germany
page 31
LIGHT MICROSCOPY
Light Sources for Epifluorescence Microscopy
Can LEDs Do It All?
Dr. R. Uhl, Till Photonics, Graefelfing, Germany
page 34
Dynamic Positioning with Nanometer Accuracy
Piezo Actuators Push Back the Technological Boundaries
S. Arnold, Physik Instrumente (PI), Karlsruhe, Germany
page 37
Correction of Chromatic Aberration
From Design to Completed Lens Systems
C. Gerhard, Dr. G. Adams, Linos Photonics, Göttingen, Germany
page 39
IMAGE PROCESSING
Comparison of Deconvolution Software
A User Point of View - Part 2
A. Griffa, Ecole Polytechnique Fédérale de Lausanne (EPFL), Switzerland
page 41
SCIENTIFIC RESEARCH ORGANIZATION
Enhancing the Efficiency of Resource Use
A Project Management System for Multi-user Technical Platforms
Dr. J. Rietdorf et al., Friedrich-Miescher-Institute, Basel, Switzerland
page 44
I&M SHOWCASES
Hitachi, page 46
Olympus, page 46
Andor, page 47
Hamamatsu, page 47
PCO Imaging, page 48
PRODUCTS
page 48
INDEX/IMPRINT
Inside Back Cover