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Imaging & Microscopy, Issue 4, 2011

Publishing Date: Nov. 08, 2011

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THIS ISSUE WILL BE AVAILABLE ONLINE AT MARCH 10th, 2012.

EDITORIAL
page 3

I&M NEWS TICKER
page 6

I&M EVENT CALENDAR
page8

ANNOUNCEMENTS

12TH INTERNATIONAL ELMI MEETING/WORKSHOP
Leuven, Belgium, June 5-8, 2012
page 9

FOCUS ON MICROSCOPY 2012
Singapore, April 1- 4, 2012
page 10

7TH INTERNATIONAL CONFERENCE ON MASS DATA ANALYSIS OF IMAGES AND SIGNALS
Berlin, Germany, July 13 - 20, 2012
page 11

EVENT-REPORT

ELMI MEETING 2011
Dr. A. Girod, Democritus University of Thrace, Alexandroupolis, Greece
page 12

MICROSCOPY CONFERENCE MC 2011 KIEL
Prof. Dr. W. Jäger, University Kiel
Prof. Dr. R. Rachel, German Society for Electron Microscopy, Dresden, Germany
page 14

RMS IN FOCUS
EUROPEAN MICROSCOPY CONGRESS
A. Winton, Royal Microscopical Society, St Clemens, United Kingdom
page 16

NEWS FROM EMS
EMS NEWSLETTER 35, OCTOBER 2011
Prof. Dr. D. Schryvers, Department of Physics, University of Antwerp, Belgium
page 18

SCANNING SECTION

TRUE SURFACE MICROSCOPY FOR TOPOGRAPHIC CONFOCAL RAMAN IMAGING
WITec, Ulm, Germany
page 20

NEAR-FIELD MICROSCOPY WITH SUPERLENSES
Dr. S. C. Kehr, School of Physics and Astronomy, University of St Andrews, Scotland, United Kingdom
page 22

PCA IN DYNAMIC FORCE SPECTROSCOPY
Dr. B. Torre et al., Italian Institute of Technology, Genova, Italy
page 26

TRIPLE-FREQUENCY ATOMIC FORCE MICROSCOPY
Prof. S. D. Solares, Dr. G. Chawla, University of Maryland at College Park, USA
page 29

COVER STORY
TIME CORRELATED SINGLE PHOTON COUNTING
C. Spriet, Science and Technology University of Lille, France
A. Schué, Leica Microsystems, Wetzlar, Germany
page 32

LIGHT MICROSCOPY

TIME-GATED STED MICROSCOPY
C. Osseforth, Prof. Dr. Jens Michaelis, Ludwig-Maximilians-University, Munich, Germany
page 34

IMAGING MOTILE MALARIA PARASITES
Dr. F. Frischknecht et al., University of Heidelberg Medical School, Heidelberg, Germany
page 38

LENSFREE OPTICAL TOMOGRAPHY
Prof. A. Ozcan, S. O. Isikman, UCLA, Electrical Engineering Department
Bioengineering Department, CNSI, Los Angeles, California, USA
page 41

IMAGE PROCESSING

THE POWER OF ImageJ
A Powerful Computational Tool in Scientific Image Processing
Dr. C. Kreutzfeldt, Phase, Lübeck, Germany
page 44

X-RAY ANALYSIS

FULL-FIELD MICROXRF IMAGING
Dr. A. Sasov et al., SkyScan, Kontich, Belgium
page 47

ELECTRON MICROSCOPY

NI-NANOSTRUCTURES WITHIN POROUS SILICON
Mag. Dr. P. Granitzer, Dr. K. Rumpf, Karl Franzens University Graz,
Dr. M. Albu, Univ.-Doz. Dr. P. Pölt, University of Technology Graz, Austria
page 50

I&M SHOWCASE
Andor, page 52
Nikon, page 53
Olympus, page 53

PRODUCTS, page 53
INDEX/IMPRINT Inside Backcover