CONTENTS
EDITORIAL page 3
I&M NEWS TICKER page 6
I&M EVENT CALENDAR page 8
ANNOUNCEMENTS
ULTRAPATH XVI - CONFERENCE ON DIAGNOSTIC ELECTRON MICROSCOPY, BASIC RESEARCH & ONCOLOGY
August 6-10, 2012, Regensburg, Germany
page 10
ICOB2012 - THIRD INTERNATIONAL CONGRESS ON BIOPHOTONICS
June 19-21, 2012, Jena, Germany
page 11
RMS IN FOCUS
EUROPEAN MICROSCOPY CONGRESS 2012
A. Winton, Royal Microscopical Society, United Kingdom
page 12
EVENT REPORT
THE EURO-BIO-IMAGING-PROJECT
Dr. M. Friedrich, GIT Verlag, Germany
page 13
NEWS FROM EMS
EMS NEWSLETTER 36, FEBRUARY 2012
Prof. Dr. D. Schryvers, University of Antwerp, Belgium
page 14
Books
page 15
LIGHT MICROSCOPY
CORE FACILITY MANAGEMENT
Dr. A. Sporbert et al., Max-Delbrueck-Center for Molecular Medicine, Germany
page 16
DIGITAL HOLOGRAPHIC MICROSCOPY
Dr. B. Kemper, University of Münster, Germany
page 19
OPTICALLY MEASURING SINGLE CELL MASS
Prof. G. Popescu, University of Illinois at Urbana-Champaign, USA
page 22
SUPERCONTINUUM WHITE LIGHT LASERS
K. P. Hansen, NKT Photonics, Denmark
page 25
SUPER-RESOLUTION MICROSCOPY
D. P. Chimento, C. A. Ascoli, Rockland Immunochemicals, USA and M. Gastard, Leica Microsystems, Switzerland
page 26
QUANTITATIVE PHASE MICROSCOPY
Dr. I. Iglesias, Universidad de Murcia, Spain
page 30
COVERSTORY
FIB-SEM with Laser Option
Carl Zeiss NTS, Germany
page 34
ELECTRON MICROSCOPY
SHEAR LOCALIZATION IN GAMMA-BASED TiAl
Dr. U. Fröbel, Helmholtz-Zentrum Geesthacht, Germany
page 36
STRAIN MAPPING AT Al-Pb INTERFACES
Dr. H. Rösner, Prof. Dr. G. Wilde, University of Münster
Prof. Dr. C. T. Koch, Ulm University, Germany
page 40
SCANNING PROBE MICROSCOPY
SINGLE VERSUS DOUBLE PASS EFM IMAGING
M. M. Kummali et al., Center of Materials Physics, CSIC-UPV/EHU, Spain
page 43
NANOMECHANICAL PROPERTIES OF MATERIALS
Dr. P. Leclère et al., University of Mons (UMONS), Belgium
PAGE 46
TIP MASS EFFECTS ON IMAGE CONTRAST
Dr. A. F. Payam, Dr. M. Fathipour, University of Tehran, Iran
page 48
I&M SHOW CASE
Andor page 50
PRODUCTS page 50
INDEX/IMPRINT Inside Back Cover