Here you will find a preview of the topics for the next issue of Imaging & Microscopy.
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PREVIEW: Imaging & Microscopy Issue 3, 2017
Publishing Date: 14.09.2017
SCANNING PROBE MICROSCOPY
Higher Eigenmode Tricks in Multifrequency AFM
Tips & Tricks for Optimizing Sensitivity and Indentation Depth
M. Nikfarjam et al.
Quantifying the Localization Precision of Single Fluorescent Emitters
Tips & Tricks for Single-Molecule Localization Microscopy
H. G. Deschout
ELECTRON AND ION MICROSCOPY
The Nanoworld in 3D
Volume EM in a Core Facility Setting
C. J. Guérin et al.