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PREVIEW: Imaging & Microscopy Issue 3, 2017

Publishing Date: 14.09.2017

SCANNING PROBE MICROSCOPY
Higher Eigenmode Tricks in Multifrequency AFM

Tips & Tricks for Optimizing Sensitivity and Indentation Depth
M. Nikfarjam et al.

LIGHT MICROSCOPY
Quantifying the Localization Precision of Single Fluorescent Emitters

Tips & Tricks for Single-Molecule Localization Microscopy
H. G. Deschout

ELECTRON AND ION MICROSCOPY
The Nanoworld in 3D

Volume EM in a Core Facility Setting
C. J. Guérin et al.

 

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