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EMAG 2011 – Quantifying the Nanoworld

Birmingham, UK, September 6-9, 2011

Aug. 19, 2011
  

EMAG 2011: The Electron Microscopy and Analysis Group's (EMAG) biennial conference has established a strong reputation as a key event in the calendars of the national and international microscopy communities, since its inaugural meeting in 1946 (then known as the Electron Microscopy Group). It has always sought to capture the latest in the development and applications of electron microscope techniques.

The Conference will continue this tradition in Birmingham, a city well known for its materials-based industries. The central location of Birmingham means that it will be easily accessible for day visitors as well as for delegates attending the whole conference and the Advanced School.

A high quality Trade Exhibition is at the heart of an EMAG conference. The 2011 event will build on the success of the Exhibition at Sheffield in 2009 with a mixture of exhibits and technical workshops to enable delegates to interact with vendors and witness the latest developments in microscopy and nanotechnology.
The scientific themes will be addressed through invited and contributed oral and poster presentations. Planned highlights are the quantitative interpretation of electron microscope images and spectra, the characterization of advanced materials, and new techniques and methods in electron microscopy.

Registration deadline: 1 September 2011

More information:
http://www.emag-iop.org

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Keywords: Electron Microscopy EMAG EMAG 2011 Material Analysis Microscopy Event Microscopy Trade Exhibition Nanotechnology

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