International Conference on Scanning Probe Microscopy on Soft and Polymeric Materials

Jun. 06, 2012

Rolduc Abbey in Kerkrade (The Netherlands) more

The International Conference on Scanning Probe Microscopy on Soft and Polymeric Materials 2012, SPM on SPM 2012, will take place between September 23rd and 26th 2012 in Rolduc Abbey in Kerkrade (The Netherlands). With this topical conference the organizers aim at bringing together researchers from academia as well as industrial participants from all continents to discuss and share the most recent developments in the application of Scanning Probe Microscopy on Soft and Polymeric Materials.

SPM methodologies have matured in the past two decades to become indispensable tools for surface analysis laboratories e.g. in nanoscience and nanotechnology worldwide. With the particular focus on the application of SPM methodologies to problems in the area of soft condensed matter, i.e. polymeric, organic and also biological materials, the scope of this vibrant and rapidly developing field shall be broadened with an eye on emerging "hot" applications and radically new approaches in SPM as well as modern surface analysis. The breadth of the topics with both academic and industrial interest is reflected in the distinguished keynote lectures by Prof. Hans-Jürgen Butt (Max Planck Institute for Polymer Research Mainz), Using microcantilevers sensors to analyze drop evaporation and thin polymer films, Prof. Ricardo Garcia (CSIC Madrid), Quantitative and molecular resolution imaging in air and liquid by dynamic AFM methods, and Prof. Vladimir Tsukruk (Georgia Institute of Technology), SPM on soft materials: imaging and beyond.

The topics covered in SPM on SPM 2012 include, among others, AFM in polymers, biology and life science / bioinspired materials; Molecular imaging; Force spectroscopy; Quantitative surface mechanics; (Nano)indentation; Tribology; Adhesion; Surface properties of thin films; Advanced and novel AFM methods; Surface chemical spectroscopy; Functional polymeric materials; Electrical measurements; Combined / hyphenated techniques; AFM in industries; Theory of AFM for soft materials; as well as Perspectives and future development of AFM. Papers presented at the conference will be considered for publication after peer-review for publication in a special issue of European Polymer Journal.

SPM on SPM 2012 will be preceded by an introductory short course on SPM on Sunday, September 23rd 2012, aiming at young researchers and beginners in the field of probe microscopy.

Imaging & Microscopy Issue 4 , 2012 as free epaper or pdf download

All leading manufacturers of SPM equipment will exhibit their latest products as part of the conference exhibit. The best posters and presentations of young talented researchers compete for the sponsored poster and presentation awards of SPM on SPM 2012.

Detailed information on SPM on SPM 2012 and the charming historic conference location close to the cross point of Belgium, Germany and the Netherlands is provided on the conference website at www.spm-p.org/

The organizing committee cordially invites you to attend this unique meeting and share your latest results.

On behalf of the organizing committee welcoming you to Rolduc for SPM on SPM 2012:

Philippe Leclère (University of Mons, Belgium)
Peter Schön (University of Twente, The Netherlands)
Holger Schönherr (University of Siegen, Germany)
G. Julius Vancso (University of Twente, The Netherlands)
Georg Bar (Dow Olefinverbund GmbH, Schkopau, Germany)
Anton-Jan Bons (ExxonMobil Chemical Europe Inc., Machelen, Belgium)

Contact
Dr. Philippe Leclère
University of Mons
Laboratory of Chemistry of Novel Materials
Mons, Belgium
Philippe.Leclere@umons.ac.be

Dr. Peter M. Schön
University of Twente
Materials Science and Technology of Polymers
Enschede, The Netherlands
p.m.schon@utwente.nl

Prof. Dr. Holger Schönherr
University of Siegen
Physical Chemistry I
Siegen, Germany
schoenherr@chemie.uni-siegen.de

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International Conference on Scanning Probe Microscopy on Soft and Polymeric Materials

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