The National Institute of Materials Physics (NIMP) in Magurele near Bucharest, Romania were equipped with apparatus for complex examination and characterization of the microstructure of materials.
The supplier of the devices for the lab is the consortium of Jeol Europe, Shimadzu Handelsgesellschaft and TESCAN. The joint collaboration offered the field emission scanning electron microscope equipped with focused ion beam LYRA3 XMU (TESCAN) and Cs-corrected field emission atomic resolution analytical transmission electron microscope JEM-ARM 200F (JEOL).
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Imaging & Microscopy Issue 1 , 2013 as free epaper or pdf download