Mar. 15, 2018ProductsElectron and Ion Microscopy
The Triple Ion Beam Milling System, Leica EM TIC 3X allows production of cross sections and planed surfaces for Scanning Electron Microscopy (SEM), Microstructure Analysis (EDS, WDS, Auger, EBSD) and, AFM investigations.
The Leica EM TXP is a target preparation device for milling, sawing, grinding, and polishing samples prior to examination by SEM, TEM, and LM techniques. An integrated stereomicroscope allows pinpointing and easy preparation of barely ...
Mar. 14, 2018ProductsElectron and Ion Microscopy
High quality sectioning of specimens for light, electron, and atomic force microscopy examination has never been easier and more precise. Leica Microsystems introduces its latest specimen preparation technology: the Leica EM UC7 ...
Mar. 01, 2018ProductsLight Microscopy
Vibrations play a decisive role in the performance of mechanical structures. This also includes the field of microelectromechanical systems (MEMS).
Feb. 16, 2018ProductsLight Microscopy
Olympus’ latest addition to the IXplore series, the IXplore SpinSR, combines super resolution, confocal and widefield imaging in one easy-to-use system with fast switching between imaging modes.
Dec. 28, 2017ProductsImage Processing
Bitplane, an Oxford Instruments Company and leader in 3D/4D microscopy image visualisation and analysis has today launched Imaris version 9.1 along with the newest member of the Imaris family, Imaris Stitcher.
Dec. 22, 2017ProductsScanning Probe Microscopy
WITec, industry-leading manufacturer of Raman imaging and correlative microscopy systems, has started shipping its Suite Five data acquisition, evaluation and processing software with the new ability to compensate for thermal and ...
Dec. 21, 2017ProductsLight Microscopy
PicoQuants FluoTime 300 fluorescence lifetime spectrometer is now available with double monochromators in excitation and emission. Due to the very high stray light rejection of these monochromators, the signal to noise ratio of the ...
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