02.09.2010Carl Zeiss introduced a unique hardware/ software interface to connect light and scanning electron microscopes for correlative microscopy in the life sciences. The "Shuttle & Find" interface enables users to recall regions of interest in fixed specimens in an electron microscope, which were previously identified in a light microscope and vice versa. The entire process takes only a few seconds.
more10.08.2010The HT7700 from Hitachi High-Technologies is the latest in Hitachi's H-7000 series of TEMs optimized for high contrast imaging at low electron doses. It features a unique, high sensitivity real-time digital CCD camera which enables all microscope operations to be performed through the graphical user interface - including setup, alignment, image adjustment and image acquisition.
more19.07.2010Hitachi's first tabletop SEM, the TM1000, took the microscopy world by storm in 2005, and with over 1000 installations since then it has become the worlds biggest selling electron microscope. Providing the power of electron microscopy with the simplicity of a digital camera, it proved to be an invaluable tool for researchers in all aspects of science and engineering.
more16.07.2010With EVO HD, Carl Zeiss is introducing its latest innovation in the conventional Scanning Electron Microscopy (C-SEM) market segment. Delivering much higher resolution at low acceleration voltages compared to present conventional SEM, the EVO HD introduces High Definition to electron microscopy.
The technological basis for this achievement is the new EVO HD source which features a higher source brightness. This brightness results in an improvement in resolution at low-kV relative to conventional tungsten SEMs.
more23.06.2010Electron Microscopy Sciences is pleased to offer the EMS 150R, a compact rotary-pumped coating system. The EMS 150R boasts high quality performance and flexibility and is suited for SEM and other coating applications.
more23.06.2010The powerful and flexible Model 1030 Automated Sample Prep (ASaP) System prepares samples that have been created by cleaving, grinding, cutting, or sectioning. The final sample configuration is ideal for analysis in a scanning electron microscope (SEM).
Processing with the ASaP significantly enhances the image quality and analytical data obtained from the sample. Operation is fully programmable and automatic, completing sample preparation rapidly enough for high-throughput applications.
more08.06.2010NanoScope Services announced the release of its 'LiveFIB' web based consultancy capability. Customers may view their samples during modification and analysis at the nanometer level, live over a web-based video conferencing facility. This powerful visual aid is combined with a simultaneous audio link which allows the real time collaboration between a nano-researcher and the expert FIB operator processing their samples. This sets a new efficiency standard for rapid prototyping and analysis. 'LiveFIB' is offered free of charge, and can be accessed via shareware from your own home or office.
more21.05.2010Piezo stepping drives from Physik Instrumente (PI) can be combined with a high-resolution linear encoder for nanometer accuracy over the complete scanning range - and are now also available for PIFOC focusing systems for microscope objectives.
more