24.02.2010

Atomic Resolution Data in Record Time

The Jeol JEM-ARM200F TEM is the first transmission electron microscope to be installed at the University of Texas at San Antonio, USA, in January, and by early February began producing imaging results. The microscpope represents more than 60 years of TEM expertise and was designed from the ground up to integrate aberration correction into a super-shielded electron column that safeguards the ultrahigh-powered optics from environmental interferences. more09.02.2010

Launch of Next-Generation Tabletop SEM

Hitachi High-Technologies Corporation announced the development of the Tabletop Microscope TM3000. Shipments of the compact, affordably priced, and exceptionally user-friendly TM3000 are scheduled to start on April 1, 2010. more08.12.2009

Cryo-SEM Systems

Gatan have launched Alto 1000, a concept in cryo-SEM that offers exactly the correct configuration of cryo-system for the user's specific applications and requirements.
No matter whether the requirement is to image specimens that are not vacuum sensitive but would be affected by e-beam heating, or if a user wishes to perform in-depth investigations of hydrated material including assessment of internal microstructure, an appropriate version of the system is available. more30.11.2009

Next Generation in Analytical EM

Carl Zeiss announced launches of product and application innovations. The start of this series is marked by the next-generation analytical field emission scanning electron microscope - the Merlin. This instrument combines requirements of ultra-high resolution imaging and analytical capabilities. "Customers have a need for more than just high resolution images of their samples," Dr. Dirk Stenkamp, Member of the Board at Carl Zeiss SMT explains. more25.11.2009

Correlative Microscopy: First Installation at Pilot Customers

Together with several pilot customers, Carl Zeiss has started application development for correlative microscopy in materials analysis and performed the initial installations of the platform Shuttle&Find. The focus of attention is the analysis of structures (e.g. polished sections), fractures, and particles. The seamless interaction of light and electron microscopes delivers time and cost benefits for all these applications. In many cases, the planned examinations are only possible at all through an interface for correlative microscopy. more23.11.2009

Speeding up Brain Mapping and 3-D Reconstruction

Electron microscopy and analysis instruments from Carl Zeiss are redefining the science of brain mapping and 3-D reconstruction. Wide-field, high resolution imaging, huge data storage and manipulation capabilities plus highly automated sample preparation techniques are yielding research results 100-times, or more, faster than ever before. As a result, a number of high-ranking research institutes are adopting these remarkable instruments, and are producing phenomenal breakthroughs in understanding the human brain. more03.11.2009

YPS Field Emission Sources

Ted Pella, announced the distribution for the YPS (York Probe Sources) Schottky Field Emission Sources. The YPS Schottky or thermal field emission (TFE) sources can be used in many brands of focused electron beam systems including SEM, TEM, Auger and CD-SEM systems. more03.11.2009

Petri Dish Holder and Heater

Asylum Research introduces an enhanced accessory for its MFP-3D AFMs. more