Sep. 20, 2016ProductsElectron and Ion Microscopy
Fully reproducible high class results with maximum resolution: The Leica EM ACE900 is a high-end sample preparation system. Perform freeze fracture, freeze etching, and e-beam coating in one instrument.
Aug. 03, 2016ProductsElectron and Ion Microscopy
Tescan is a multi-national company and a leading global developer and supplier of scanning electron microscopes (SEMs), focused ion beam scanning electron microscope (FIB-SEM) systems, unique solutions for SEM and FIB-SEM ...
The CHIPSCANNER from Raith uniquely combines high-resolution electron optics, multiple, highly efficient electron detectors and most precise Laser interferometer Stage technology.
Quorum Technologies will show a full range of electron microscopy preparation instruments – including the industry standard “Q” series of sputter coater/carbon coaters. Both Q150 and larger Q300 models are fully automatic ...
The in situ microscopy leader, Protochips’ comprehensive easy-to-use products have been featured in over 500 academic papers, and are the only in situ holders approved by the major microscope manufacturers.
NanoMEGAS has provided since 2004 next generation advanced microscopy applications (Patent protected): TEM orientation/phase mapping (ASTAR) & Strain mapping at nm scale; a novel TOPSPIN platform has been developed as analytical ...
Building off of 50 years of SEM innovation is JEOL’s JSM-IT100 series SEM. Ease of use is a key feature of our InTouchScopeTM series while still maintaining the versatility and expandability expected from a research grade SEM.
EMC2016 is the perfect place to see what’s new and exciting from Hitachi and to discuss your microscopy needs. We’ll be showcasing a wide range of instrumentation including the new HF5000 200kV TEM (pictured).
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