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Atomic Resolution Data in Record Time
First JEOL JEM-ARM200F at University of San Antonio
The Jeol JEM-ARM200F TEM is the first transmission electron microscope to be installed at the University of Texas at San Antonio, USA, in January, and by early February began producing imaging results. The microscpope represents more than 60 years of TEM expertise and was designed from the ground up to integrate aberration correction into a super-shielded electron column that safeguards the ultrahigh-powered optics from environmental interferences. The microscope enables both atom-by-atom imaging resolution and unmatched spatial resolution for atom-to-atom chemical mapping of materials, including EDS (energy-dispersive x-ray spectroscopy) and EELS (electron energy-loss spectroscopy). The completely new electron column design integrates S/TEM with Cs correction for atomic spatial energy resolution combined with high probe currents for microanalysis.
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Keywords: JEM-ARM200F JEOL SEM TEM Transmission Electron Microscope
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