Correlative Microscopy

First Installation at Pilot Customers

Nov. 25, 2009

Mounting of the sample holder with the adapter into the vacuum chamber of a scanning electron microscope is as easy as 1 -2 -3

Mounting of the sample holder with the adapter into the vacuum chamber of a scanning electron ... more

Together with several pilot customers, Carl Zeiss has started application development for correlative microscopy in materials analysis and performed the initial installations of the platform Shuttle&Find. The focus of attention is the analysis of structures (e.g. polished sections), fractures, and particles. The seamless interaction of light and electron microscopes delivers time and cost benefits for all these applications. In many cases, the planned examinations are only possible at all through an interface for correlative microscopy.
Scientists at the ZHAW Institute of Materials and Process Engineering in Winterthur, Switzerland, for example, have been tasked with describing as precisely as possible the "ausferritic" structure of a bainitic spheroidal graphite cast iron and with analyzing precipitations and material inclusions. Scientist Christof Scherrer explains: "Particularly with large polished samples with structural components in the micrometer range (high magnifications), correlative microscopy is the only way to relocate the same locations without doubt." Because of its special properties such as tensile strength and wear resistance (hardness), this material is used for gears and the parts of combustion engines, for example.
Shuttle&Find interface for correlative microscopy in materials analysis is a joint development of the Light Microscopy, Electron Microscopy and Central Research divisions of Carl Zeiss.

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Carl Zeiss Microscopy - Nano Technology Systems
Carl-Zeiss-Str. 56
73447 Oberkochen, Baden-Württemberg
Germany

Tel: +49 7364 20 22 94
Fax: +49 7364 20 4970
Web: http://www.zeiss.com/microscopy

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