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EDAX Introduces Apollo Silicon Drift Detector Series for TEM
A New Standard in Electron Microscopy
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EDAX released the Apollo Silicon Drift Detector (SDD) Series for the transmission electron microscope (TEM). The series includes the Apollo XLT with a Super Ultra Thin Window (SUTW) and the Apollo XLTW, a windowless version.
The windowless version further maximizes the collection efficiency and improves sensitivity up to 500% for low-energy X-rays. As a result, the mapping speed and light element detection in low concentrations are enhanced with the Apollo XLTW.
The Series incorporates data acquisition and signal processing electronics into the detector to simplify installation and to eliminate the need for a separate data acquisition enclosure. The integrated detector presents an elegant design that improves performance and offers easy remote access via Ethernet from virtually any computer.
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Keywords: Apollo Data Aquisition detector Edax Electron Microscopy Silicon Drift Detector TEM Transmission Electron Microscopy X-Ray
EDAX Inc.
91 McKee Drive
NJ 07430 Mahwah
USA
Tel: +1 201 529-4880
Fax: +1 201 529-3156
Web: http://www.edax.com
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