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Elemental Mapping with High Resolution: FEI's Titan G2 80-200 with ChemiSTEM Technology
![The GaAs [110] dumbbell splitting of 0.14 nm is clearly resolved by chemical mapping using energy ...](/sites/imaging-git.com/files/images/special/3083728_minimal.jpg "The GaAs [110] dumbbell splitting of 0.14 nm is clearly resolved by chemical mapping using energy dispersive x-ray analysis with a Titan G2 80-200 with ChemiSTEM Technology and a probe Cs-corrector at 200 kV acceleration voltage, using a 200 pA probe current. On the right hand side the atomic structure of GaAs the [110] projection is shown along with the grayscale HAADF-STEM image. This represents the highest resolution ever obtained in atomic elemental mapping by any technique using an S/TEM."){kind=small}
FEI Company announced the release of its Titan G2 80-200 with ChemiSTEM Technology, a new member of the Titan G2 series of S/TEM (scanning / transmission electron microscopes).
The Titan G2 80-200's analytical speed and sensitivity result from the FEI ChemiSTEM Technology, including the X-FEG (an ultra-stable high-brightness Schottky FEG source), the high sensitivity Super-X EDX detector system (4 windowless silicon drift detectors integrated deeply into the objective lens), and mapping electronics capable of acquiring 100,000 spectra/second. The elemental mapping capability can be maintained over the entire accelerating voltage range of 200 kV down to 80 kV, which can help maximize signal and reduce sample damage in beam senstive materials.
Keywords: ChemiSTEM Technology Elemental Mapping Fei Company STEM TEM Titan G2 80-200 Transmission Electron Microscopes
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