Enhanced Resolution in the Low kv Region

EVO HD: The Latest Innovation from Carl Zeiss

Scale of butterfly wing (Pieris Brassicae) taken on EVO HD electron microscope at 5kV acceleration ... more

With EVO HD, Carl Zeiss is introducing its latest innovation in the conventional Scanning Electron Microscopy (C-SEM) market segment. Delivering much higher resolution at low acceleration voltages compared to present conventional SEM, the EVO HD introduces High Definition to electron microscopy.
The technological basis for this achievement is the new EVO HD source which features a higher source brightness. This brightness results in an improvement in resolution at low-kV relative to conventional tungsten SEMs. The improved source properties also aid analytical applications with a 30% increase in resolution at 30kV and 1nA.

Related Articles :

• FEI Acquires ASPEX
• Ametek Acquires Technical Manufacturing Corporation
• FEI Launches MAPS Software for Cellular Biology Research
• Ni-Nanostructures Within Porous Silicon
• VM12 Strengthing by Precipitates - TEM Study of Precipitates in the Martensitic VM12 Steel

Keywords: Carl Zeiss Life Science Material Analysis Nano Scanning Electron Microscopy SEM

Carl Zeiss Microscopy - Nano Technology Systems
Carl-Zeiss-Str. 56
73447 Oberkochen, Baden-Württemberg
Germany

Tel: +49 7364 20 22 94
Fax: +49 7364 20 4970
Web: http://www.zeiss.com/microscopy

• Legal
  • Terms and Conditions
  • Privacy Policy
  • Imprint
• Help
  • FAQ
  • Sitemap
  • Contact
• Participate
  • Blog
  • RSS
• Related Publications
  • messtec drives Automation
  • INSPECT
  • PRO-4-PRO
  • G.I.T. Laboratory Journal