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Fei: Titan 80-300

Jun. 01, 2005

Fei: Titan 80-300. Fei announced its new scanning/transmission electron microscope (S/TEM), the Titan 80-300, dedicated to corrected microscopy. The system is the world’s most advanced commercially-available microscope, yielding atomic-scale imaging with resolution below 0.7 Ångström. The Titan announcement comes just one year after FEI became the first developer and manufacturer of commercial electron microscopes to achieve subÅngström resolution on FEI’s marketleading Tecnai microscope, using a monochromator and an aberration corrector. The system is designed as a highly-upgradeable aberration-corrected system that will enable corrector and monochromator technology to enter into mainstream nanotechnology research and industrial markets.

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