Jeol Introduces Multi-Touch Screen Interface for Scanning Electron Microscopy

Multi-touch Interface Creates New Electron Microscope Experience with JEOL InTouch Scope more

  

Jeol has announced that they now offer InTouch Scope, an analytical, low vacuum Scanning Electron Microscope (SEM) with integrated EDS analysis and multi-touch screen functionality.

The user can expand windows and images with the sweep of two fingers, dial in magnification and focus with a swipe, and select operating parameters, analytical functions, or measure distances just by tapping the PC or notebook touch screen.

Key Features are:
o automatic SEM condition setup based on sample type
o simultaneous multiple live image and movie capture
o easy sample navigation at 5x - 300,000x magnifications
o quantitative and qualitative elemental analysis
o low and high vacuum operation

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Keywords: App EDS EDS analysis Electron Microscopy Energy Dispersive Spectroscopy Interface JEOL Scanning Electron Microscopy SDD SDD detector SEM touchscreen

Jeol USA Inc.
11 Dearborn Road
Peabody , MA 01960
USA

Tel: +1 978 536 2273
Fax: +1 978 536 2205
Web: http://www.jeol.com

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