Products
SuperFlat AFM
Now from Agar Scientific
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Agar Scientific announced the availability of the SuperFlat AFM from Kleindiek to combine the imaging power of SEM and AFM. Information on lateral dimensions and material from in-situ inspection can be complemented by precise AFM topographical and frictional information. A feature of the SuperFlat AFM is its size. The tool is flat and compact enough to fit through the majority of SEM load-locks. In addition, its size offers stability and vibration dampening advantages.
A sample or tip exchange takes only a minute and a tedious laser adjustment process is not required. By dispensing with complicated optical force read-out, the system's size could be reduced to a height of 10mm. The small dimensions allow for load lockability and therefore high sample throughput. The SF-AFM consists of a micromanipulator and a super flat piezo scanner mounted to a load-lockable platform. The AFM cantilever is mounted to the micromanipulator - which has a resolution of 0.25 nm in X and Y directions and 3 nm in Z direction. Once the cantilever has been positioned over the area of interest, the piezo scanner is used during the AFM measurement. The three-axis piezo scanner has a scan range of 15 μm, 15 μm, 3 μm and a resolution of 0.25 nm. It can be used for AFM imaging as well as for recording force vs. distance curves.
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Keywords: AFM Agar Scientific Kleindiek nanotechnology Micromanipulator Piezo Scanner SEM SF-AFM SuperFlat AFM
Agar Scientific Ltd.
Unit 7, M11 Business 0
Stansted, Essex CM24 8GF
UK
Tel: 44 1279 813 519
Fax: 44 1279 815106
Web: http://www.agarscientific.com
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