WITec’s RISE Correlative Microscopy is Now Available with ZEISS SEM Systems

  • RISE image of a piece of hematite, showing this mineral and goethite in several crystal orientations, that were identified from the Raman spectra.RISE image of a piece of hematite, showing this mineral and goethite in several crystal orientations, that were identified from the Raman spectra.
  • RISE image of a piece of hematite, showing this mineral and goethite in several crystal orientations, that were identified from the Raman spectra.
  • Combination of WITec Raman microscope and ZEISS Sigma 300 SEM

The WITec RISE microscopy mode for correlative Raman-SEM imaging is now compatible with Zeiss Sigma 300, a field emission scanning electron microscope (FE-SEM). With this jointly-developed hybrid system, WITec and Zeiss have furthered their collaboration to provide a fully-integrated instrument available as an OEM product through Zeiss that features a standard, unmodified vacuum chamber and SEM column along with a complete confocal Raman microscope and spectrometer. It expands the range of choices available to the researcher and incorporates generations of experience in Raman spectroscopic imaging and advanced structural analysis.

Correlative microscopy involves using two or more microscopy techniques. RISE correlative microscopy combines a confocal Raman Imaging and a Scanning Electron (= RISE) microscope in a single system. Raman microscopy, as a label-free, non-destructive technology for the identification and imaging of the molecular composition of a sample, is the perfect complement to SEM (scanning electron microscopy), which visualizes the surface structure of a sample, and the often-associated EDX (energy-dispersive X-ray spectroscopy) that can only identify elemental constituents.

The seamless combination of the two techniques offers a distinct advantage when investigating samples, improves ease-of-use and accelerates experimental workflow. The research-grade optical microscope capability integral to every WITec microscope also helps researchers survey their sample and quickly locate areas of interest. Both the objective and sample stage required for Raman microscopy are placed within the SEM’s vacuum chamber and can therefore remain under vacuum for all measurements; the sample is simply transferred between the Raman and SEM measuring positions using the stage of Zeiss Sigma 300. The configuration allows the Raman microscope to be attached through a standard port of the SEM.

The correlation of data and control of Raman measurements are carried out through WITec’s Suite FIVE software, which features a new operating concept with an intuitive interface, automated components and sophisticated software and data analysis routines.

Statement of Dr. Olaf Hollricher, Co-founder and Director of R&D at WITec
“Our Raman technology can visualize the distribution of chemical species within a sample, and do it quickly. Combine that with the structural resolution of SEM and you get a properly comprehensive understanding of a sample. It’s a powerful instrument that’s intuitive as well.”

Statement of Dr. Michael Rauscher, Head of Business Sector Materials Sciences at ZEISS Microscopy
“Comprehensive characterization is essential throughout many scientific fields such as battery research, geology and life sciences. The integration of RISE microscopy in our correlative portfolio aims at delivering cutting edge technology to these and many other areas of research. We are very happy that with WITec we have a partner that shares our ambition to drive scientific advancement.”

Statement of Dr. Philippe Ayasse, Project Manager for RISE microscopy at WITec
"RISE really fulfills the promise of correlative microscopy. It gives the user the strengths of Raman and SEM without compromise, all consolidated in one easy to use instrument.”

All the functions of the respective stand-alone SEM and Raman systems are preserved when combined. Switching between measurement modes is accomplished quickly and easily through the software, which also facilitates the transformation of Raman spectroscopic data into an image which can then be overlaid onto the SEM image to produce a RISE image. This correlative approach can greatly benefit researchers in nanotechnology, life sciences, geosciences, pharmaceutics, materials research and many other fields of application.

If you require more information, please contact us here.

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WITec GmbH
Lise-Meitner-Str. 6
89081 Ulm
Germany
Phone: +49 731 140 700
Telefax: +49 731 140 70 200

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