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JPK Introduces Software With Quantitative Imaging Capabilities For Challenging AFM Samples

Dec. 09, 2011
168 bp DNA nano-rings on Poly-L-Ornithine protein layer in buffer solution and force distance curve at the marked point. Scan size: 80 x 80 nm. Z-range: 2.5 nm. Sample imaged in closed-loop with QI capability. Sample courtesy of Dr Damian Ackermann, LIMES, University of Bonn, Germany.
168 bp DNA nano-rings on Poly-L-Ornithine protein layer in buffer solution and force distance curve ... more

JPK Instruments has introduced QI, a quantitative imaging mode for the recently launched NanoWizard 3 AFM system.


The software has been developed to make AFM imaging easier than ever before. With QI, a force curve-based imaging mode, the user has the full control over the tip-sample force at every pixel of the image. There is no need for setpoint or gain adjustment while scanning.


The Software is Especially Suited for Challenging Samples such as
◦ Soft Samples (Hydrogels or Biomolecules)
◦ Sticky Samples (Polymers or Bacteria)
◦ Loosely Attached Samples (Nanotubes or Virus Particles in Fluid)
◦ Samples with Steep Edges (Powders, MEMS Structures)


QI mode is particularly useful in areas that demand both high resolution and force sensitivity such as biology, polymers and surface science.

The software delivers real quantitative data with high spatial resolution. AFM moves from purely imaging to deliver quantitative measurement. To measure a real and complete force distance curve at every pixel of the image gives all information about the local tip-sample interaction with high spatial resolution.


Statement of Heiko Haschke, Head of Applications and Customer Support
"We designed this software to be straightforward for a beginner to use while also having advanced options to meet the needs of the user who likes to apply their own data processing routines. It is the fact that we are measuring complete force curves at each pixel that provides real utility for the user - easy-to-produce quantitative data."

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Keywords: AFM Atomic force microscopy image processing MEMS microelectronical mechanical systems (MEMS) NanoWizard 3 NanoWizard AFM imaging Polymer software Surface Analysis

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Bouchestr. 12
12435 Berlin
Germany

Tel: +49 30/533112070
Fax: +49 30/533122555
Web: http://www.jpk.com



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