Nov. 06, 2009
XGT-1700WR the new line-up of XGT-1000WR series and equipped with new optical system to analyze elements with high sensitivity. These models use an X-ray guide tube to generate a 3mm irradiation beam with multi-filter with 4 specific filters (Pb/Cd/Cr,Cl/5 WR elements) and secondary filter(between sample and detector) with ON/OFF positions are equipped. Improved detection sensitivity is realized through the use of a dual filter.
XGT-1700WR is equipped with dewar of liquid nitrogen.
moreNov. 06, 2009
The AutoProbe 200 is Omniprobe's most popular nano-manipulator system. It is a fully automated, multi-purpose nano-positioning system capable of in-situ lift-out, electrical measurements, nano-mechanical testing and charge neutralization in the FIB, Auger or SEM. The computer controlled system offers high throughput, high accuracy (100nm standard, 10nm optional) and a field-proven excellent success rate for all tasks. moreNov. 06, 2009
NT-MDT announced that the Solver Next has received the coveted R&D 100 award for the first commercial scanning probe microscope featuring both Atomic Force Microscopy (AFM) and Scanning Tunneling Microscopy (STM) in one. This prestigious annual award recognizes the top 100 new technologies from the past year, across a broad range of industries. moreNov. 06, 2009
Windsor Scientific announced the launch of the next generation Nanosurf scanning probe microscope, the easyScan 2 FlexAFM. This system brings a new dimension to the easyScan line of SPMs - adding operational modes as well as liquid imaging, whilst maintaining the easyScan range's renowned ease of use. The FlexAFM's flexure-based electromagnetic XY scanner allows metrology like applications in air or liquid, offering linear, flat, and fast scanning performance. moreNov. 06, 2009
PicoQuant has extended the number of available wavelengths of picosecond pulsed diode lasers by the release of a new laser head at 450 nm and an improved laser head at 635 nm. Both laser heads can be controlled by the established laser drivers of the PDL-Series. With pulse durations well below 100 ps, the pulsed lasers head perfectly matches the time resolution of mainstream detectors, yet at a price much lower than that of commonly used mode-locked lasers. moreNov. 06, 2009
Horiba Jobin Yvon presents two systems for high resolution microscopy. The XGT-7000 represents a completely new generation of XRF microscope. It offers a seamless merger between optical observation and elemental analysis functions. Unique hardware features ensure the system offers versatility and flexibility for every measurement. A choice of two software controlled x-ray guide tubes with diameters ranging from a unique 10 µm through to 1.2 mm allow conditions to be optimised for a range of measurements, including both micro and macro. moreNov. 05, 2009
The XuM is an SEM-hosted high resolution x-ray microscope which provides an internal view of the structure of samples without cross-sectioning. Providing 2D, stereo and full 3D tomographic imaging, the XuM adds the third dimension to scanning electron microscopy. moreNov. 05, 2009
X-Ray Diffraction (XRD) is a high-tech, non-destructive technique for analyzing a wide range of materials. Throughout industry and research institutions, XRD has become an indispensable method for materials investigation, characterization and quality control. Example areas of application include over others, qualitative and quantitative phase analysis, crystallography, structure and relaxation determination, micro-diffraction, nano-materials, lab- and process automation, and high-throughput polymorph screening. more