Nov. 09, 2009
JPK Instruments announced new electrochemical capabilities for their NanoWizard AFM systems. Electrochemical experiments study redox reactions of substances at a solid-liquid interface. With atomic force microscopy, high-resolution images can be obtained in liquid as the electrochemical reaction progresses. Electrochemistry spans a wide range of fields, from the corrosion of metal surfaces through to the role of protein electron transfer processes in biosensors. moreNov. 09, 2009
The NanoZoomer 2.0 Virtual Microscopy Systems from Hamamatsu Photonics feature a significant increase in scanning speed, by a factor of two, and substantially reduce the time needed to create digital slides from glass slides.
moreNov. 06, 2009
Quantax is a powerful system available for energy dispersive X-ray microanalysis on SEM and electron microprobe. Several system levels and a multitude of options are available for scaling and tuning the system for a wide range of analytical tasks and application environments. Systems of all levels provide state-of-the-art qualitative as well as true standardless quantitative elemental analysis. A standard based Φ(ρ, z) quantification package is optionally available for dedicated analytical tasks. moreNov. 06, 2009
With the X-ray Guide Tube the bench top XGT-5000 systems allow convenient access to X-ray fluorescence analysis with high spatial resolution - from 1.2 mm down to 10 µm (HORIBA original). moreNov. 06, 2009
XGT-1700WR the new line-up of XGT-1000WR series and equipped with new optical system to analyze elements with high sensitivity. These models use an X-ray guide tube to generate a 3mm irradiation beam with multi-filter with 4 specific filters (Pb/Cd/Cr,Cl/5 WR elements) and secondary filter(between sample and detector) with ON/OFF positions are equipped. Improved detection sensitivity is realized through the use of a dual filter.
XGT-1700WR is equipped with dewar of liquid nitrogen.
moreNov. 06, 2009
The AutoProbe 200 is Omniprobe's most popular nano-manipulator system. It is a fully automated, multi-purpose nano-positioning system capable of in-situ lift-out, electrical measurements, nano-mechanical testing and charge neutralization in the FIB, Auger or SEM. The computer controlled system offers high throughput, high accuracy (100nm standard, 10nm optional) and a field-proven excellent success rate for all tasks. moreNov. 06, 2009
NT-MDT announced that the Solver Next has received the coveted R&D 100 award for the first commercial scanning probe microscope featuring both Atomic Force Microscopy (AFM) and Scanning Tunneling Microscopy (STM) in one. This prestigious annual award recognizes the top 100 new technologies from the past year, across a broad range of industries. moreNov. 06, 2009
Windsor Scientific announced the launch of the next generation Nanosurf scanning probe microscope, the easyScan 2 FlexAFM. This system brings a new dimension to the easyScan line of SPMs - adding operational modes as well as liquid imaging, whilst maintaining the easyScan range's renowned ease of use. The FlexAFM's flexure-based electromagnetic XY scanner allows metrology like applications in air or liquid, offering linear, flat, and fast scanning performance. more