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Oct. 12, 2009

3D Imaging

Hyphenated Systems, a world-wide provider of hybrid microscopy solutions for three-dimensional imaging and metrology in micro and nanotechnology, announced the release of its HS200A NanoScale Optical Profiler. The HS200A adds extensive automation capability to the companys workhorse the HS200OP for most repeatable non-destructive analyses in critical metrology, inspection, failure analysis and quality control applications. more
High End Optical Filters for Biophysics
Oct. 12, 2009

High End Optical Filters for Biophysics

Single molecule experiments, multiphoton spectroscopy or TIRF microscopy require optical filters perfectly matched to the corresponding laser lines.
Clean-up filters, dichroics and emitters for solid laser, gas lasers and laserdiodes made with high end optical filter technology will be offered from AHF analysentechnik AG. The company will offer best support for optimizing complex spectroscopic setups with the long time experience in specifying filter components. New products for multiline laser applications offer new chances. more
Pelco BioWave Pro
Oct. 12, 2009

Pelco BioWave Pro

True variable wattage control and the unique new Pelco Coldspot are integrated in the new Pelco BioWave Pro microwave tissue processing system. Standard protocols are already programmed in the system with full editing facilities for additional protocols. Remote access allows protocol monitoring from any location. more
Optical Quality Control on Surfaces
Oct. 12, 2009

Optical Quality Control on Surfaces

Surfaces differ in roughness, reflectivity, form, planarity and other parameters. In order to be able to measure a wide variety of samples, Sensofar PLµ 2300 incorporates the measurement modes interferometry as well as confocal. To measure the roughness of a very smooth surface is as easy as measuring the form of a part with steep flanks. The sensor head may be configured for the use as tabletop instrument, attached to a robot arm or as portable system to measure large samples. more
Electron Multiplier Camera
Oct. 12, 2009

Electron Multiplier Camera

The EM-CCD camera model C9100-02 by Hamamatsu Photonics allows for 2000 fold signal amplification by improved on chip electronics. The frame transfer CCD chip features 1000 x 1000 pixels resolution. Due to the frame rate of more than 30 Hz in full resolution this camera is especially suited for imaging quick moving objects. The readout noise is less than one electron (rms) at 14 bit signal depth. Thus extremely low signals can be reliably detected and displayed with high image quality. more
A New Microscopy System
Oct. 12, 2009

A New Microscopy System

Arivis presents the arivis Browser – a new, innovative imaging software system. The arivis Browser software handles images of almost any size with up to 5 dimensions. The software controls different devices as microscopes, cameras or stages and imports images from most of the important imaging formats. It can be extended very flexible by new device controls, importers or handling and analysis tools using the built-in plug-in system. It allows fluorescence as well as widefield imaging, time series as well as high content screening applications. more
ImagEM - Electron Multiplier CCD Camera
Oct. 12, 2009

ImagEM - Electron Multiplier CCD Camera

Hamamatsu’s ImagEM Enhanced has a lot of functions like two operational modes w/o signal amplification, several trigger functions incl. programmable trigger output and a highly sensitivt back-thinned CCD chip. Compared to its predecessor ImagEM it features important protect functions for reducing gain degradation. This EM-gain protect function cause image acquisition to Stopp in case of too high light intensities and thus avoid gain degrading overexposure. In this way intrinsic EM-CCD degradation qualities are minimized. more
New Software for Feature / Particle Analysis
Oct. 12, 2009

New Software for Feature / Particle Analysis

Bruker AXS Microanalysis introduced Esprit Feature. This new particle analysis software is designed for the companys Quantax EDS analysis systems. Esprit Feature utilizes the Quantax image digitizers and the XFlash EDS Detectors speed for fast, flexible particle identification and chemical classification. Among its powerful image analysis functions are configurable feature detection, a convenient review function as well as chart and report generation. more



Ima
ging & Microscopy Issue 1 , 2013 as free epaper or pdf download

 

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Ima
ging & Microscopy Issue 1 , 2013 as free epaper or pdf download