Dec. 28, 2015ProductsScanning Probe Microscopy
MikroMasch has introduced a new line of AFM tips – OPUS (optimized positioning upon sample).
Dec. 24, 2015ProductsLight Microscopy
Tip Enhanced Raman Scattering (TERS) has been hampered by extremely long acquisition times, measured in hours, required for collection of reasonably high pixel density TERS maps. With the XploRA Nano from Horiba, the innovative integration ...
Dec. 22, 2015ProductsElectron and Ion Microscopy
Zeiss has introduced it´s MultiSEM 506 which features 91 beams working in parallel and increases the throughput of the Zeiss MultiSEM 505 by a factor of three.
Dec. 21, 2015ProductsLight Microscopy
Digital piezo-controllers from piezosystem jena (d-Drive and d-Drive pro) offer flexible control for customized systems such as cameras, illumination systems, optical shutters or external measuring systems.
Dec. 18, 2015ProductsScanning Probe Microscopy
JPK Instruments has released NanoWizard 4 NanoScience AFM, providing atomic resolution and fast scanning capabilities
Dec. 16, 2015ProductsLight Microscopy
The multi-laser engine iChrome SLE from Toptica supports multi-color applications that require separate microscope input ports (FRAP, TIRF, confocal microscopy / spinning disk, for example).
Dec. 15, 2015ProductsScanning Probe Microscopy
Thanks to the force-guided crossed roller bearings (anti creep), the linear stage PIMag V-551 from Physik Instrumente achieves a travel accuracy of 1 µm over a travel range of 100 mm.
Dec. 04, 2015ProductsLight Microscopy
Leica Microsystems has introduced HyVolution which combines super-sensitive HyD detectors with Huygens deconvolution by SVI. This combination increases confocal resolution down to 140 nm and delivers crisp multicolor images, which convey ...
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