Nov. 22, 2017ProductsScanning Probe Microscopy
Park NX20 300mm enables AFM inspection and scans over the entire sample area of 300mm wafers by using a full 300mm x 300mm motorized XY stage so the system can access any location on a 300mm wafer.
Oct. 26, 2017ProductsScanning Probe Microscopy
The Zeiss Crossbeam 550 focused ion beam scanning electron microscope (FIB-SEM) has been voted by a jury of experts from the German Design Council as a winner of the German Design Award 2018 in the category "Material and ...
Jun. 21, 2017ProductsScanning Probe Microscopy
Park Systems, world-leading manufacturer of Atomic Force Microscopes (AFM) just announced new Park NX12, an affordable versatile platform for analytical chemistry and electrochemistry researchers and multi-user facilities.
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