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AppNano AFM Cantilevers
The Schaefer-Tec group has signed a distribution contract with the company Applied NanoStructures Inc. for the distribution of the AppNano cantilevers in Europe. The AFM cantilevers are now available from all Schaefer offices. A wide variety of silicon AFM cantilevers for Contact Mode, Non-Contact/Tapping Mode, Force Modulation, Super Sharp, Silicon Nitride, MFM, Electrical Conductivity, High Aspect Ratio as well as Tipless Cantilevers are being produced. Due to the alignment structure the AppNano cantilevers are very well suited for the Nanosurf AFM's but also for all other AFM brands. more
Combined AFM Imaging and Force Measurement
With NanoWizard 3 BioScience AFM, JPK Instruments is introducing their third generation, dedicated BioAFM system. The core of the new system is HyperDrive, a SuperResolution AFM fluid imaging technique. With extremely low tip-sample interactions, samples are never damaged. It is available with the NanoWizard 3 AFM head and the new Vortis high bandwidth, low noise control electronics. The system is stable to drift and has the ability to detect the smallest cantilever deflections. more
OnLine AFM/SPM Probe Store
Asylum Research announces that its new automated AFM/SPM Probe Store is now online. The probe store provides simple search, sort, selection, quotation and purchase for a wide variety of different probes. more
DualBeam Microscope
FEI Company introduced the Helios NanoLab x50 DualBeam Series. The Helios 450 series is designed primarily for today's advanced semiconductor labs that are dealing with numerous challenges, including shrinking dimensions at sub 32nm nodes; advanced packaging techniques, such as TSVs and multi-die stacks; as well as a higher volume of samples requiring TEM imaging. The Helios 650 is designed for academic and industrial research centers that need to do advanced material characterization and modification down to the single nanometer scale. more
Seamless Integration of Atomic Force and Light Microscopy
Agilent Technologies announced the availability of the Agilent 6000ILM AFM, an atomic force microscopy (AFM) platform. The Platform is a research solution that seamlessly integrates the capabilities of an AFM with those of an inverted light microscope or an inverted confocal microscope. The 6000ILM supports a wide variety of scanning probe microscopy imaging modes and lets life science researchers go beyond the optical diffraction limit to achieve nanoscale spatial resolution with unprecedented ease of use. more
High Linearity in Atomic Force Microscopy
Park Systems XE (which stands for crosstalk elimination) Atomic Force Microscopes provide completely eliminated background curvature thanks to the flexure XY scanners and show no bowing even on scans of the flattest samples. This enables precision nanometrology for challenging problems in research and industry. Position sensors provide linear feedback control for high accuracy, high precision measurements. more
Sharp Nitride Lever - Probes
Veeco is committed to delivering high quality, applications-enabling cantilever technology in the market. The Probes Nanofabrication Facility produces fine probes for not only current applications, but also for the emerging research of tomorrow. For example the standard configuration probes (SNL) or the Microlever version (MSNL) in the SNL probes series. Veeco has released the latest in super-sharp nitride probes for contact or fluid tapping applications. The new Sharp Nitride Lever (SNL) Probe Series can unlock the true high-resolution in samples, without higher expenses. more
Microscopy & Nanomanipulation
PI's P-563.3CD PIMars stage is a piezo flexure-guided scanning / nanomanipulation system. The unit enables precision motion control with resolution in the sub-nanometer realm and 340x340x340 µm travel in XYZ. Integrated, direct-measuring capacitance sensors and digital closed-loop control boost linearity by up to three orders of magnitude over conventional piezo stages. The product incorporate high-force solid state piezo actuator drives, frictionless flexure guiding systems and absolute measuring capacitive position sensors. more
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