Dec. 22, 2017ProductsScanning Probe Microscopy
WITec, industry-leading manufacturer of Raman imaging and correlative microscopy systems, has started shipping its Suite Five data acquisition, evaluation and processing software with the new ability to compensate for thermal and ...
Nov. 22, 2017ProductsScanning Probe Microscopy
Park NX20 300mm enables AFM inspection and scans over the entire sample area of 300mm wafers by using a full 300mm x 300mm motorized XY stage so the system can access any location on a 300mm wafer.
Oct. 26, 2017ProductsScanning Probe Microscopy
The Zeiss Crossbeam 550 focused ion beam scanning electron microscope (FIB-SEM) has been voted by a jury of experts from the German Design Council as a winner of the German Design Award 2018 in the category "Material and ...
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