Jan. 23, 2012

Tescan Introduces an Integrated Mineral Analyzer (TIMA)

Tescan has introduced the Tescan Integrated Mineral Analyzer (TIMA). TIMA, a fully automated, high throughput, analytical scanning electron microscope, is designed specifically for the mining and minerals processing industry. moreJan. 11, 2012

Park Systems NX10: Research-Grade True Non-Contact Atomic Force Microscope

Schaefer Technology has introduced the Park Systems NX10, a very accurate Atomic Force Microscope (AFM) which brings high imaging accuracy, scan speeds, and tip life to the next generation of researchers, all at an affordable price. moreDec. 06, 2011

Bruker Releases an Integrated System for Correlated Atomic Force Microscopy and Raman Spectroscopic ...

Bruker has released Innova-IRIS, an integrated system for correlated atomic force microscopy and Raman spectroscopic imaging. moreNov. 03, 2011

Variable Field Module for Magnetic Atomic Force Microscopy Experiments

Asylum Research has launched the Variable Field Module2 (VFM2) for magnetic atomic force microscopy applications with MFP-3D Atomic Force Microscopes (AFM). moreOct. 06, 2011

JPK Instruments Launch the NanoWizard 3 NanoOptics AFM System

JPK Instruments, a  manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, continue to expand its family of  research systems with the availability of the NanoWizard 3 NanoOptics AFM system. The NanoWizard NanoOptics head comes with  physical and optical access to the sample from top and bottom as well as from front and side, even when the head and condenser are in place. Additionally, it has an integrated port for fiber SNOM applications. moreSep. 02, 2011

Combination of Optical Microscopy and AFM-

PicoQuant has combined its time-resolved confocal fluorescence microscope MicroTime200 with Brukers BioScope Catalyst Atomic Force Microscope (AFM). The synchronized acquisition of these two systems enables simultaneous recordings of AFM and optical images of the same sample region and makes new investigation schemes in the f moreAug. 16, 2011

Bruker Releases Atomic Force Microscope for Patterned Sapphire Substrate Metrology

With the Dimension Edge PSS Atomic Force Microscope, Bruker has introduced a production-environment Atomic Force Microscope specifically tailored for patterned sapphire substrate (PSS) metrology in high brightness light-emitting diode (HB-LED) manufacturing. moreJun. 10, 2011

Extended DNA Dynamics Experiments by Applying Atomic Force Microscopy –

JPK Instruments has reported on the work from the Pharmaceutical Sciences Department of the Medical School at the University of Nebraska. The Department has selected the JPK ForceRobot 300 system to extend their studies applying atomic force microscopy in the measurement of single molecule force spectroscopy. more