Feb. 16, 2017ProductsScanning Probe Microscopy
Oxford Instruments Asylum Research has launched its new European Atomic Force Microscopy (AFM) Probe Store.
Jan. 30, 2017ProductsScanning Probe Microscopy
Nanometer precision and motion control industry company Physik Instrumente (PI) delivers solutions for very small position changes, coupled with speed and high force, in its P-630 nanopositioning stages.
Jan. 27, 2017ProductsScanning Probe Microscopy
JPK Instruments, a manufacturer of nanoanalytic instrumentation for life sciences and soft matter research, reports the use of their Nano Wizard AFM system at the University of South Australia for smart wound healing, plant toxicology and ...
Jan. 25, 2017ProductsScanning Probe Microscopy
Bruker has introduced the e-Flash FS and e-Flash HD in a new generation of detectors for electron backscatter diffraction (EBSD) analysis on scanning electron microscopes (SEM).
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