2009 R&D 100 award for Solver Next

Nov. 06, 2009

NTMDT, Solver NEXT, Dual AFM+SPM more

NT-MDT announced that the Solver Next has received the coveted R&D 100 award for the first commercial scanning probe microscope featuring both Atomic Force Microscopy (AFM) and Scanning Tunneling Microscopy (STM) in one. This prestigious annual award recognizes the top 100 new technologies from the past year, across a broad range of industries.

Built and priced especially for university labs and more routine industrial applications, Solver Next provides the flexibility and versatility of over 40 different measurement modes, without the need for advanced training required to run most scanning probe instruments. The full system, including sample loading, can be run remotely, making it ideal for telemicroscopy as well as hazardous environments such as nuclear facilities. The system runs Windows using the MAC hardware and operating system. MAC's have long been known for their exceptional image management and operating stability while the Windows platform is better known for the broad range of available applications. This system combines the best of both worlds. In addition, NT-MDT has cleverly added an iPhone MAC applet. Images and dynamic 3D presentations can readily be shared on-site or emailed. The applet also includes simple measurements such as length, depth, and average surface roughness.

Email request

Company Homepage

NT-MDT Co.
PF 158, Building314 A
124482 Selenograd, Moskau
Russia

Tel: +7 495 913-5736
Fax: +7 495 9135739
Web: http://www.ntmdt.ru

Read Imaging & Microscopy Issue 3 as free epaper or download the pdf

Imaging-GIT.com

Products

2009 R&D 100 award for Solver Next

Reader comments (0)

GIT Verlag