Bruker Releases an Integrated System for Correlated Atomic Force Microscopy and Raman Spectroscopic Imaging

Innova-IRIS, a TERS-Ready AFM System more

Bruker has released Innova-IRIS, an integrated system for correlated atomic force microscopy and Raman spectroscopic imaging.

The combination of ultra-low closed loop noise, no-drift mechanical stability, and wide-open optical access make the Innova  AFM a suitable platform for challenging Tip-Enhanced Raman Spectroscopy (TERS) research. With hardware integration specifically designed to accelerate a TERS setup  and an IRIS software module that offers automated mapping, the system transforms today's leading AFM and Raman instruments into a proven TERS-enabled research platform.

Statement of M. Munch, President of the Bruker Nano Surfaces Division
"Researchers have had to accept severe performance limitations to combine atomic force microscopy with Raman spectroscopy, and there has been a real need for commercial products that allow more scientists to perform these complementary techniques with the highest level of performance. Our extensive AFM expertise and collaboration with leading Raman spectrometer manufacturers have allowed us to develop seamlessly integrated AFM-Raman systems that can be tailored to specific application requirements, allowing researchers to concentrate on the data rather than the nuances of the technologies."

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Keywords: AFM Atomic force microscopy Bruker Chemical Mapping Confocal raman Imaging Innova-IRIS Mapping Raman spectroscopy Spectroscopy TERS tip-enhanced Raman spectroscopy

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112 Robin Hill Road
93117 Santa Barbara, CA
USA

Tel: +1.805.967.1400
Web: http://www.bruker-axs.com

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