EBSD Detectors and Visualization Software

  • The e-Flash FS and e-Flash HD in a new generation of detectors for electron backscatter diffractionThe e-Flash FS and e-Flash HD in a new generation of detectors for electron backscatter diffraction

Bruker has introduced the e-Flash FS and e-Flash HD in a new generation of detectors for electron backscatter diffraction (EBSD) analysis on scanning electron microscopes (SEM).

These cover applications from characterization of minerals and alloys to analysis of nano and functional materials. A three-fold sensitivity increase of the FS version expands the range of high-speed EBSD applications. The e-Flash HD detector has a CCD camera resolution of 1,600 x 1,200 pixels, enabling highly detailed Kikuchi patterns. Improvements to the cooling system mean the CCD’s dark current is reduced by a factor of four. The Esprit Qube software package provides advanced post-processing and visualization of 3D EBSD/EDS data cubes using data sets acquired with electron backscatter diffraction systems (EBSD) and/or energy-dispersive X-ray spectrometers (EDS).

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Contact

Bruker Nano Analytics
Schwarzschildstr. 12
12489 Berlin
Germany
Phone: +49 30 670 990 0
Telefax: +49 30 670 990 30

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