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JPK Instruments Launch the NanoWizard 3 NanoOptics AFM System

Oct. 06, 2011
NanoWizard 3 NanoOptics AFM system
NanoWizard 3 NanoOptics AFM system more

JPK Instruments, a  manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, continue to expand its family of  research systems with the availability of the NanoWizard 3 NanoOptics AFM system.

The NanoWizard NanoOptics head comes with  physical and optical access to the sample from top and bottom as well as from front and side, even when the head and condenser are in place. Additionally, it has an integrated port for fiber SNOM applications.

The new system is ready for a broad range of applications from nanoscale optical imaging by aperture and scattering-type SNOM to experiments involving interactions of light with the sample such as absorption, excitation, nonlinear effects and quenching. These include aperture fiber SNOM experiments where an integrated fiber SNOM port in the NanoOptics head and the tuning fork module allows hassle-free integration of techniques.

The NanoWizard3 NanoOptics AFM can be used in a large number of configurations. The AFM system can be used for many more applications. It is also possible to interface and run different heads such as the ForceRobot 300 and the CellHesion 200 or to use the TopViewOptics.

 

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Keywords: AFM AFM System Atomic force microscopy Confocal Nanoscopy JPK Instruments Microscopy NanoOptics Nanotechnology NanoWizard 3 Scanning Near-field Optical Microscopy SNOM

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JPK Instruments AG
Bouchestr. 12
12435 Berlin
Germany

Tel: +49 30/533112070
Fax: +49 30/533122555
Web: http://www.jpk.com



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