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Measurements of Adhesive Strength, Deformations and Cracking
NanoRack Sample Stretching Stage from Asylum Research
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Asylum Research has announced the new NanoRack Sample Stretching Stage Accessory for its MFP-3D AFMs. This high-strain, high-travel manual stretching stage provides two axis stress control of tensile loaded samples under different loads. Automatic load cell calibration provides integrated force measurements with MFP-3D images or other measurements, and returns both stress and strain data.Maximum sample load is 80N. Applications for the NanoRack stage include direct measurements to determine interfacial adhesive strength of nano- and micro-scale domains within polymer blends, especially blends generated in-situ in polymerization reactors. Additional applications include measurements of forces required to induce cracking in a variety of biological and inorganic materials. The stage is compatible with a wide variety of AFM imaging techniques including Phase and Dual AC for enhanced contrast of material properties, as well as the MFP-3D's Ztherm option for localized thermal analysis.
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Keywords: AFM Asylum Research Imaging of Nanoscale Objects MFP-3D Scanning Probe Microscopy
Asylum Research
6310 Hollister Ave. 0
93117 Santa Barbara, CA
USA
Tel: +1 805 696 6467
Fax: +1 805 6966444
Web: http://www.asylumresearch.com
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