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Microscopy & Nanomanipulation

XYZ Piezo Flexure Stage for Micromanufacturing

Apr. 26, 2010
PIMars XYZ piezo flexure stages provide up to 340x340x340 µm travel, sub-nanometer resolution, and very fast response. They are designed for nano-manipulation, micro-manufacturing  and scanning microscopy applications.
PIMars XYZ piezo flexure stages provide up to 340x340x340 µm travel, sub-nanometer resolution, and ... more

PI's P-563.3CD PIMars stage is a piezo flexure-guided scanning / nanomanipulation system. The unit enables precision motion control with resolution in the sub-nanometer realm and 340x340x340 µm travel in XYZ. Integrated, direct-measuring capacitance sensors and digital closed-loop control boost linearity by up to three orders of magnitude over conventional piezo stages. The product incorporate high-force solid state piezo actuator drives, frictionless flexure guiding systems and absolute measuring capacitive position sensors. The high force of the solid state piezo actuators allows for fast response in the millisec range and high scanning frequencies.
These stages are based on a different design principle than conventional scanning stages. The XYZ system consists of only one moving part, a single module rather than three individual stacked modules, as common in other XYZ systems. This "parallel-kinematics" mechanical design is complemented by a parallel direct- motion metrology feedback system. With parallel direct-metrology, all non-contact sensors monitor the moving platform in reference it to ground "from the outside". They can "see" off-axis and runout errors. The controller then eliminates unwanted motion in real-time. Conventional serial-metrology sensors (integrated in each axis) cannot detect off-axis errors. Parallel motion metrology allows for significantly higher overall XYZ precision.

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Keywords: Bio-Tecnology Micromanufacturing Nano-Imprint Nano-Manipulation Nanotechnology P-563.3CD PIMars Physik Instrumente Positioning Scanning Microscopy Semiconductor & Data-Storage Test Equipment

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