NanoWizard 3 NanoScience System from JPK: AFM Performance in Liquids and Air, Integrated with Optical Microscopy

JPK's NanoWizard 3 NanoScience AFM more

JPK Instruments, a manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, continues to expand its family of high performance research systems with the announcement of the availability of the NanoWizard 3 NanoScience AFM system.

The NanoWizard 3 NanoScience system design provides the highest AFM performance in liquids and air, integrated with optical microscopy. It provides optimum imaging in air and liquid for single molecules, polymers and nanomaterials. The tip-scanning head equipped with a flexure scanner gives highest flexibility for a large variety of different samples. In particular, large sample size scanning is possible. The expanded flexibility and modularity of design coupled with the widest range of operation modes and accessories from electrochemistry to the tip-assisted optics module makes this the ideal platform for multiple users and applications.

The core of the new system family is HyperDrive, a SuperResolution AFM imaging technique. With extremely low tip-sample interactions, samples are never damaged. It is available with the NanoWizard 3 AFM head and the new Vortis high bandwidth, low noise control electronics. The system is extremely stable to drift and has the ability to detect the smallest cantilever deflections enabling some of the most stunning images ever produced in a commercial system. This digital controller has been built with flexible operation for the user in mind.

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Keywords: AFM Atomic Force Microscope JPK Instruments NanoWizard 3 Optical Microscopy Super-Resolution Imaging

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12435 Berlin
Germany

Tel: +49 30/533112070
Fax: +49 30/533122555
Web: http://www.jpk.com

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