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Park Systems NX10: Research-Grade True Non-Contact Atomic Force Microscope
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Schaefer Technology has introduced the Park Systems NX10, a very accurate Atomic Force Microscope (AFM) which brings high imaging accuracy, scan speeds, and tip life to the next generation of researchers, all at an affordable price.
Data accuracy is of paramount importance to nanotechnology researchers as the credibility of their research depends upon accurate results. The NX10 is a research-grade True Non-Contact AFM, featuring Z-servo speed, XYZ scanner linearity, closed-loop detector noise, and minimized thermal drift. The ease of use of NX10 makes AFM convenient and intuitive for new and experienced users alike.
The Park Systems AFM's are represented in many European countries by the Schaefer-Tec group.
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Keywords: AFM Atomic force microscopy Nanotechnology NX10 Park Systems Schaefer-Tec True Non-contact Mode
Schaefer-Tec AG
Badimatte 21
3422 Kirchberg
Switzerland
Tel: +41 34 423 70 70
Web: www.schaefer-tec.com
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