Schaefer Technology has introduced the Park Systems NX10, a very accurate Atomic Force Microscope (AFM) which brings high imaging accuracy, scan speeds, and tip life to the next generation of researchers, all at an affordable price.
Data accuracy is of paramount importance to nanotechnology researchers as the credibility of their research depends upon accurate results. The NX10 is a research-grade True Non-Contact AFM, featuring Z-servo speed, XYZ scanner linearity, closed-loop detector noise, and minimized thermal drift. The ease of use of NX10 makes AFM convenient and intuitive for new and experienced users alike.
The Park Systems AFM's are represented in many European countries by the Schaefer-Tec group.
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Imaging & Microscopy Issue 4 , 2012 as free epaper or pdf download