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Seamless Integration of Atomic Force and Light Microscopy
The AFM 6000ILM from Agilent Technologies
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Agilent Technologies announced the availability of the Agilent 6000ILM AFM, an atomic force microscopy (AFM) platform. The Platform is a research solution that seamlessly integrates the capabilities of an AFM with those of an inverted light microscope or an inverted confocal microscope. The 6000ILM supports a wide variety of scanning probe microscopy imaging modes and lets life science researchers go beyond the optical diffraction limit to achieve nanoscale spatial resolution with unprecedented ease of use.
The product uses a computer-controlled laser with automated photodetector alignment and offers simple point-and-shoot AFM imaging based on the optical image. A high-stability, precision motorized stage directs the movement of the sample beneath the AFM tip for measurement. Researchers can use off-the-shelf 0.55NA condensers to perform fluorescence or DIC imaging, simultaneously with AFM imaging, to quickly create high-precision overlays of the resultant images. The platform facilitates high-resolution topography and mapping, the ability to collocate points of interest sequentially, and the acquisition of more detailed information about a sample's structure and material property domains.
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Keywords: AFM 6000ILM AFM Tips Agilent Technologies Atomic force microscopy DIC Imaging Light Microscopy nanoscale Optical Images Photodetector Scanning Probe Microscopy Surface Mapping
Agilent Technologies Inc.
5301 Stevens Creek Blvd
CA 95051 Santa Clara
USA
Tel: +1 408 3458886
Fax: +1 408 3458474
Web: www.agilent.com
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