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Tescan Introduces an Integrated Mineral Analyzer (TIMA)
Tescan has introduced the Tescan Integrated Mineral Analyzer (TIMA). TIMA, a fully automated, high throughput, analytical scanning electron microscope, is designed specifically for the mining and minerals processing industry.
The TIMA solution will address applications such as Mineral Liberation Analysis, process optimization, remediation, and search for precious metals and rare earths.
TIMA measures modal abundance, size-by-size liberation, mineral association, and performs PGM search automatically on multiple samples of grain mounts and thin or polished sections.
Technical Background
The technology is based on a completely integrated EDX system that performs full spectrum imaging at very fast scan speeds. Image analysis in TIMA is performed simultaneously with SEM backscatter electron images and a suite of X-ray images. The level of hardware integration of the SEM and EDX allows for unprecedented acquisition speeds for fully automated data collection, resulting in fast, accurate, repeatable and reliable results.
Keywords: Automation EDX elemental analysis High Throughput minerals Scanning Electron Microscopy Tescan
Tescan a.s
Libušina třída 21
623 00 Brno
Czech Republic
Tel: +420 547 130 411
Fax: +420 547 130 415
Web: http://www.tescan.com
Imaging & Microscopy Issue 1 , 2013 as free epaper or pdf download
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