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True Surface Microscopy
WITec Introduces Next Evolutionary Leap in Microscope Configurations
Surface Topography With High Precision: WITec has launched the True Surface Microscopy option. The core element of this imaging mode is an integrated sensor for optical profilometry. Large-area topographic coordinates from the profilometer measurement can be precisely correlated with the large-area confocal Raman imaging data. This allows for the first time confocal Raman imaging along heavily inclined or very rough samples with the true surface held in constant focus while maintaining the highest confocality. With the new imaging mode, samples that had previously required extensive preparation in order to obtain a certain surface flatness can now be effortlessly and automatically characterized as they are. Complete system control as well as extensive data evaluation are integrated within the WITec Control and WITec Project software environment, guaranteeing renowned ease-of-use.
The profilometry capabilities of True Surface Imaging mode allows scan ranges of up to 50x100 mm with a spatial resolution on the order of 100 nm vertically and 10 µm laterally. Measuring distances of 10 mm and more provide flexibility for variable sample size requirements. In combination with AFM, the profilometer can even be used as a pre-inspection tool to determine topographic features of interest for high-resolution AFM investigations on large samples. The overall performance and exceptionally accurate imaging capabilities of True Surface Microscopy are beneficial for many applications, including the characterization of micromechanical, medical, or semiconductor devices, the mapping of functionalized surfaces, or the imaging of bio-medical or pharmaceutical material surface properties.
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Keywords: AFM Confocal raman Imaging optical profiler Profilometry Raman Raman Microscopy Scanning Probe Microscopy True Surface Microscopy WITec
WITec GmbH
Lise-Meitner-Str. 6
89081 Ulm
Germany
Tel: +49 731 140 700
Fax: +49 731 140 7020
Web: http://www.witec.de
Imaging & Microscopy Issue 4 as free epaper or pdf download
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