The VFM2 is ideal for researchers who want to apply magnetic fields to their atomic force microscopy experiments and applies continuously adjustable magnetic fields parallel to the sample plane approaching one Tesla with one Gauss resolution.
◦ Magnetic Force Microscopy (MFM)
◦ Conductive AFM (C-AFM)
◦ All other applications where the sample's properties are magnetic field dependent
◦ Earth magnets
◦ No heat, thermal drift, or mechanical vibration
◦ Software controllable field intensity
Statement of Roger Proksch
"Prior to the introduction of the VFM2, high magnetic field measurements required complicated superconducting or water-cooled magnets, neither of which were particularly friendly to low-noise, high precision AFM measurements. Our team, headed by Maarten Rutgers, has made a startling increase in field strength along with increased measurement precision and ease of use. This is truly a major step forward in ambient AFM."
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Imaging & Microscopy Issue 4 , 2012 as free epaper or pdf download