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Apollo SDD Series for EDS Analysis
New Detectors for X-ray analysis
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EDAX has introduced the next series of Apollo SDD detectors for X-ray microanalysis. "While the Apollo Series offers a range of detector sizes and performance levels including a large-area SDD chip," notes Judy O'Loughlin, Director of Product Marketing for EDAX, "it emphasizes a more important feature, the positioning of the detectors close to the sample, making it comparable to the best-designed Si(Li) detectors. EDAX's Apollo Series offers users the best of both worlds. All SDDs are able to map at high resolution, and all SDDs can map at high count rates. Users of the Apollo Series gain the benefits of both simultaneously".
For the past several years SDD detectors have been able to process a very high volume of X-rays, making high-speed mapping possible. At times, the resolution was sacrificed to achieve increased throughput. With the new detectors, high-resolution, high-speed mapping is defined as better than 135 eV resolution at 100,000 cps and deadtime of 30% throughput.
The new series complements to the Genesis software, bringing all the advanced features for qualitative and quantitative analysis, mapping and particle analysis to the materials characterization scientist. "At the same time, the Apollo Series fits seamlessly into the EDAX family of materials characterization tools, effortlessly integrating with our market-leading EBSD cameras and our technology-leading WDS systems," concludes O'Loughlin.
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Keywords: Apollo Apollo SDD detector EBSD Edax EDS analysis Electron Backscatter Diffraction Genesis Software high-speed mapping SDD detector WDS X-ray microanalysis
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