Rigaku Corporation has added MiniFlex 600 and MiniFlex 300 to its MiniFlex series of benchtop X-ray diffraction (XRD) analyzers.
The 5th generation MiniFlex is a general purpose X-ray diffractometer that can perform qualitative and quantitative analysis of polycrystalline materials.
Key Features of MiniFlex 600
◦ 600 W X-ray Source
◦ Fast Analysis
◦ Improved Overall Throughput
◦ D/teX High Speed detector (Optional)
Key Features of MiniFlex 300
◦ 300 W X-ray Source
◦ Does Not Require an External Heat Exchanger
Each model is engineered to maximize flexibility in a benchtop package. The optional graphite monochromator, coupled with the standard scintillation counter, maximizes sensitivity by optimizing peak-to-background ratios. If resolution is paramount, incident and diffracted beam slits can be selected to provide the desired resolution. For high sample throughput, MiniFlex is the only benchtop XRD system with an available sample changer. Whether used for teaching X-ray diffraction at the college and university level or routine industrial quality assurance, the MiniFlex delivers both performance and value.
Rigaku Americas Corporation
9009 New Trails Drive
77381 The Woodlands, TX
Imaging & Microscopy Issue 4 , 2012 as free epaper or pdf download