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High-Resolution with X-Ray
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Horiba Jobin Yvon presents two systems for high resolution microscopy. The XGT-7000 represents a completely new generation of XRF microscope. It offers a seamless merger between optical observation and elemental analysis functions. Unique hardware features ensure the system offers versatility and flexibility for every measurement. A choice of two software controlled x-ray guide tubes with diameters ranging from a unique 10 µm through to 1.2 mm allow conditions to be optimised for a range of measurements, including both micro and macro. Similarly, with the unique Dual Vacuum Modes it is possible to switch within seconds between a high sensitivity full vacuum mode and a versatile localised vacuum mode.
On the other side the X-ray Guide Tube the bench top XGT-5000 systems allow convenient access to X-ray fluorescence analysis with high spatial resolution - from 1.2 mm down to 10 µm. The object is placed in the sample chamber and analysed at normal atmospheric pressure. The sample is visualized with coaxial geometry, so that parallax errors are removed. The high intensity beam delivered by these guide tubes ensures that acquisition times are kept to a minimum. The mono-capillary design of these guide tubes are ideally suited for high intensity element imaging, even of samples which are not perfectly flat.
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Keywords: Fluoescence Analysis high resolution microscopy Horiba X-Ray X-Ray Analysis XGT-5000 XGT-7000 XRF XRF Microscope
HORIBA Jobin Yvon GmbH
Hauptstr. 1
82008 Unterhaching, Bayern
Germany
Tel: +49 89 462317-0
Fax: +49 89 462317-99
Web: www.horiba.com
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