Science
Science Overview
In light microscopy, photons in the ultraviolet, visible, and infrared wavelength range are passing a definite glass lens formation to allow for the monitoring of object details in higher magnification and higher resolution. Originally the limit of the optical resolution was estimated at 0.2 µm. Today sub-diffraction technologies enable a “super-resolution” up to 20 nm. more
In electron and ion microscopy, a charged particle beam helps to observe the surface morphology. Objects are not seen as real objects, but visualized with their electron density. The electron or ion beam is focused on the specimen by using magnetic and electrostatic lenses. The achieved resolution is less than 0.1 nm. more
In scanning probe microscopy, an image of the specimen is obtained by moving a probe above the sample surface line by line and recording the probe-surface interaction as a function of position. Both the sample topography and local specimen properties can be probed down to the atomic scale. more
In X-ray analysis, heavy elements are detected in the presence of lighter ones, to give critical-edge absorption to identify elemental composition, and to identify crystal structures by diffraction patterns. more
In image processing, mathematical operations are performed to improve the informative value of a monitored image. Typically, image processing encompasses image acquisition, sampling, coding, enhancement, restoration, analysis, and pattern recognition. more
This section features laboratory notes and experimental protocols. To find entries related to light (LM), electron/ion/X-ray (EM), and scanning probe (SPM) microscopy, please fill in the search field “LM protocol”, “EM protocol”, or “SPM protocol”. You need to use quotation marks for the entire term. more
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