Jun. 01, 2008

Damping in Dynamic Force Microscopy: The Role of Functionalized Groups

Damping in Dynamic Force Microscopy: The Role of Functionalized Groups. As a relatively new scanning probe technique, Dynamic Force Microscopy [1] has proved to be a powerful tool, allowing for imaging the topography of a sample surface with true atomic resolution. Besides topographic imaging, the simultaneously recorded damping signal is related to non-conservative interaction between tip and sample. For a molecular system, we show the tip-induced switching of the functionalized groups of the organic molecule leading to an enhanced damping signal. moreJun. 01, 2008

Nano-Thermal Analysis

In the last decennia there has been a substantial and growing interest in polymer ‘thin' films. These films (typically below 200 nm thickness) show remarkable properties, sometimes completely different from those in bulk. Understanding how the morphology of thin polymer (blend) films evolves with time or preparation methods is of great technological importance [1].

Nano-thermal Analysis

AFM turns out to be the suited technique for studying these films. It is possible to determine different images (e.g. topographic, friction and phase) in one scan. moreJun. 01, 2008

Electrospun Polymeric Fine Fibres

Electrospun Polymeric Fine Fibres: Electrospinning is recognised for being a versatile and prolific method for producing polymeric fibres with diameters ranging from micro- to nanometers. By choosing polymers with particular physical properties, employing complex multiple systems or compounding with non-polymeric particles, the fibre properties can be tailored to ideally suit a particular application.
moreJun. 01, 2008

FIB/SEM for Biological Data Mining

PART I moreJun. 01, 2008

Scanning Ion Conductance Microscopy

Scanning ion conductance microscopy (SICM) is an imaging technique, measuring conductance through
a nanometer-sized pipette tip opening that is brought close to a sample surface submerged in electrolyte ­solution. In combination with an integrated shear force distance control, the local ion conductance can be measured independently of and simultaneously with topography. The design of a shear-force-controlled SICM is presented and a new imaging mode that significantly improves image quality is discussed.

Introduction
moreJun. 01, 2008

Functional Amyloid

Amyloid is notorious for its association with a range of debilitating and incurable human diseases. However, evidence is now emerging that the amyloid fold may be functional and utilized by a broad range of organisms. Atomic force microscopy has helped in the identification of amyloid in the natural adhesives of biofouling terrestrial algae that attach to a range of natural and man-made surfaces. AFM is now being used to pull apart a variety of amyloid fibrils in order to elucidate their structure. moreJun. 01, 2008

Imaging Atomic-Scale Spin Structures

A fundamental understanding of magnetic and spin-dependent phenomena requires the determination of spin structures and spin excitations down to the atomic scale. The direct visualization of atomic-scale spin structures [1 - 4] has first been accomplished for magnetic metals by combining the atomic resolution capability of Scanning Tunnelling Microscopy (STM) [5, 6] with spin sensitivity, based on vacuum tunnelling of spin-polarized electrons [7]. moreJun. 01, 2008

Electron Energy Loss Spectroscopy

The combination of high resolution imaging with energy loss spectroscopy allows to resolve questions about the morphology, structure, composition and electronic structure of a material in a single instrument. By the assistance of band structure calculations and simulated EELS spectra, the experimental data can be analyzed in detail. Following this approach it is possible to study the relation between the geometric and electronic structure of materials at the nanometer scale.

Introduction
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