Nov. 03, 2009
Nowadays, deconvolution in cell and tissue imaging has matured into a standard restoration technique that is accessible to large fraction of the microscopy community thanks to steadily improving algorithms. Still, deconvolution is often the rate-limiting step in the analysis of the acquired data, even at today's computer performance. Here, we present the Huygens Remote Manager, an open-source, efficient, multi-user web-based interface for parallel batch deconvolutions. moreNov. 03, 2009
Superresolution methods in digital holographic microscopy provide a useful tool to overcome the Abbe‘s diffraction limit when using modest microscope lenses. The process improves the cutoff frequency of the microscope lens by means of the generation of a synthetic aperture based on time multiplexing and using 3 main stages: optical coding, optical decoding, and digital post-processing. After the whole process, a superresolved image is obtained by Fourier transformation of the synthetic aperture.
The Limited Resolving Power of Imaging Systems moreNov. 03, 2009
The Langmuir-Blodgett (LB) thin film deposition technique [1-2] is a suitable method to form monolayer or multilayer organic thin films on the nanoscale. Other advantages of LB films are follows as: the film thickness and molecular architecture can easily be controlled, a centrosymmetric or non-centrosymmetric ultra-thin films can be fabricated using LB film fabrication procedures. Therefore these organic thin films have many potential applications in physics, chemistry, biology and molecular electronics. moreNov. 03, 2009
Confocal technique and white light interferometry have demonstrated to be suitable for characterization of transparent thick films. Layer's thickness and 3D topographies of its upper and lower interfaces can be determined from the two peaks in the confocal axial response or from the two sets of interference fringes developed during a vertical scan. Refraction index mismatch between immersion medium and layer worsens the performance of these techniques when profiling lower surface.
Surface Profiling Techniques moreNov. 03, 2009
The easiest imaging mode for measuring the local conductivity of a sample is to combine the current measurements with contact mode Atomic Force Microscopy (AFM) imaging. Current-Sensing Atomic Force Microscopy (CS-AFM) is a powerful technique for electrical characterization of conductivity variation in resistive samples. It allows direct and simultaneous visualization of the topography and current distribution of a sample. In the studies presented in this report the CS-AFM technique has been implemented to study Cr contact formation on the 6H-SiC(0001). moreNov. 03, 2009
The increasing demands on the quality and consumption safety of grain imply, for food economy, increased expenditures for product and process supervision. Within the framework of the control of goods received and quality of the processing industries, various laboratory methods are applied at present to check the properties of the products and the observance of the standards. moreNov. 03, 2009
We describe a comprehensive characterization of biological and polymer samples, when a particular organelle or macromolecule cluster is cut into two parts: One part is used for AFM and the other for TEM. Information about the microstructure of the sample (from TEM) in combination with the data on distribution, morphology and mechanical properties of macromolecular/chain content (from AFM) reveals new structural aspects going beyond the possibilities offered by AFM or TEM alone.
What is more valid: information obtained by eyes or by hand? moreNov. 03, 2009
Thin intrinsic silicon films containing microcrystalline grains embedded in amorphous tissue were studied by two complementary microscopy techniques. The conductive atomic force microscopy was performed in standard ambient conditions with very sensitive (pA) current detection. The cross-sectional transmission electron microscopy images of the amorphous phase revealed the columnar structure, which was attributed to the bumpy structures on the surface.