Sep. 27, 2012

In Situ and Analytical Transmission Electron Microscopy

In situ and analytical transmission electron microscopy (TEM) has been used to investigate the mechanism of material transport during Al-induced layer exchange (ALILE) and crystallization of amorphous Si (a-Si). moreJun. 18, 2012

A Vision on Functional Polymer Systems

Advances in detector sensitivity and electron illumination flexibility allow for application of Scanning Transmission Electron Microscopy (STEM) in atypical conditions. Recently we have demonstrated that in optimized imaging conditions modern STEM detectors are able to provide contrast between purely carbon-based organic materials without the need of additional heavy element staining, and we have introduced virtually parallel illumination STEM imaging of micrometer thick carbon-based specimens with nanometer resolution.
moreJun. 08, 2012

Imaging TRISO-Particle in FIB SEM

The characterization of a tri-isotropic (TRISO) coated particle by using a Focused Ion Beam Scanning Electron Microscope (FIB SEM) is illustrated. TRISO particles are used as fuel in high temperature gas reactors and the quality of the coating layers surrounding the kernel is important for the safety of the reactor. It is shown that the FIB SEM is an ideal instrument for the preparation and investigation of TRISO particles. moreJun. 04, 2012

TEM for Strain-engineered Devices

The performance of today's state of the art semiconductor electronic devices depends on charge transport within very small volumes of the active device regions. One means of optimizing the band structure of these small volumes of semiconductor material for carrier mobility is to tune its strain state.
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