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Heliotis Optical Profilers Integrates Digital Surf´s Mountains Technology
Jan. 31, 2012

Heliotis Optical Profilers Integrates Digital Surf´s Mountains Technology

Digital Surf´s MountainsMap Imaging Topography surface metrology software will be supplied with Heliotis M3 and M3-XL 3D Optical Profilers.
Main Application Fields of the Optical Profilers
◦ Scientific Research
◦ Lab Automation
◦ Process Development
◦ Quality Inspection
◦ Production Monitoring (incl. Mcromechanics, Electronics, Life Sciences and Forensics) more
Carl Zeiss Introduces Redesigned Scale Objective Lens for 3D Imaging of Brain Tissue
Dec. 13, 2011

Carl Zeiss Introduces Redesigned Scale Objective Lens for 3D Imaging of Brain Tissue

Carl Zeiss MicroImaging has announced the availability of the completely redesigned plan-apochromatic 20x/1.0 VIS-IR objective lens. more
Nikon Announces NIS-Elements Software Upgrade
Nov. 14, 2011

Nikon Announces NIS-Elements Software Upgrade

Nikon has announced the availability of version 4.0 of NIS-Elements. Version 4.0 offers the ability to control current existing and the latest Nikon systems, ensuring familiarity on all Nikon imaging platforms.
New Features
◦ Over 100 new functions for improved user experience
◦ New support for third party cameras and hardware
◦ Easier switching between microscope applications
◦ Improved user rights management more
Bruker Releases Atomic Force Microscope for Patterned Sapphire Substrate Metrology
Aug. 16, 2011

Bruker Releases Atomic Force Microscope for Patterned Sapphire Substrate Metrology

With the Dimension Edge PSS Atomic Force Microscope, Bruker has introduced a production-environment Atomic Force Microscope specifically tailored for patterned sapphire substrate (PSS) metrology in high brightness light-emitting diode (HB-LED) manufacturing. more
Surface Imaging and Metrology Software from Digital Surf
Jun. 02, 2011

Surface Imaging and Metrology Software from Digital Surf

Digital Surf has announced the release of MountainsMap 6.1, the latest version of its MountainsMap surface imaging and analysis software for all types of surface metrology instrument including confocal microscopes, white light interferometers, scanning probe microscopes, and contact and non-contact profilometers. more
Lens Positioning in 3D with Sub-Nanometer Precision
May. 31, 2011

Lens Positioning in 3D with Sub-Nanometer Precision

Mad City Labs has announced the introduction of the Nano-F3D lens nanopositioning system.
Application Fields
The system is designed to position an objective lens in three dimensions with sub-nanometer accuracy and repeatability. With a travel range of 100 μm in each axis, the Nano-F3D is suitable for 4Pi microscopy as well as other imaging and inspection applications. more
TILL Photonics Introduces Intravital 2P: An Upright Two Photon Microscope
Mar. 07, 2011

TILL Photonics Introduces Intravital 2P: An Upright Two Photon Microscope

TILL Photonics has introduced Intravital2P, an upright two photon microscope platform which is specifically designed to meet the demands for functional in vivo or intravital imaging in live animal.
The Intravital2P features a non-descanned detection scheme based on two high-sensitive GaAsP PMTS with equivalent collection efficiency. more
Mar. 04, 2011

Nanosurf and Zurich Instruments Announce Partnership

Nanosurf and Zurich Instruments has announced the start of a strategic technology partnership to develop ease of use high-performance scanning probe microscopes:
Nanosurf will propose the Zurich Instruments 50 MHz PLL as upgrade path to its easyPLL and easyPLL plus platform, thereby granting Zurich Instruments immediate access to its large community of PLL users more
Andor Introduces a Two Camera Imaging Adapter
Mar. 04, 2011

Andor Introduces a Two Camera Imaging Adapter

Andor Technology has launched TuCam, a high performance, two-camera adapter for macro or microscopic imaging applications.

TuCam can be configured for simultaneous imaging from two similar cameras or as a switch between camera models with different imaging capabilities. The solution is particularly suited for the detection of two different fluorophores in experiments such as co-localization FRET or ratiometric ion signalling. more
Phenom Desktop Scanning Electron Microscope: Second Generation is now available
Mar. 02, 2011

Phenom Desktop Scanning Electron Microscope: Second Generation is now available

Phenom-World introduces the second generation of desktop scanning electron microscopes: Phenom G2 pro and Phenom G2 pure. more
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