Nov. 01, 2008

3D Orientation Microscopy

Combining electron backscatter diffraction (EBSD), a scanning electron microscope (SEM) and a focused ion beam (FIB) together into a single instrument enables three dimensional (3D) characterization of microstructure in crystalline materials. Combining these techniques together has enormous potential in materials science.

Electron Backscatter Diffraction

Traditionally, microstructure refers to features that are visually evident in an optical or electron microscope. However, many critical aspects of microstructure are not visually evident. moreNov. 01, 2007

3D Orientation Microscopy: Electron Backscatter Diffraction in a Combined FIB/SEM

3D Orientation Microscopy: Electron Backscatter Diffraction in a Combined FIB/SEM. Combining electron backscatter diffraction (EBSD), a scanning electron microscope (SEM) and a focused ion beam (FIB) together into a single instrument enables three dimensional (3D) characterization of microstructure in crystalline materials. Combining these techniques together has enormous potential in materials science. Electron Backscatter Diffraction more